uniqprobe™

uniqprobe™
uniqprobe™
  • Small variations of force constant and resonance frequency 
  • Cantilevers made from stress free material leading to absolutely straight cantilevers 
  • Typical tip radius of curvature better than 10nm
  • Reduced drift for SPM applications in liquid environments
  • Chemically inert
  • High mechanical Q-factor for high sensitivity
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact qp-CONT
YES Contact Mode,
Biological Applications / Soft Contact Measurement,
Fluid Tapping / AC Mode
0.1 30
qp-SCONT
YES Soft Contact Mode,
Biological Applications / Soft Contact Measurement,
Lateral / Friction Force Microscopy,
Fluid Tapping / AC Mode
0.01 11
Non-contact qp-BioT
(2) cantilevers
YES Biological Applications / Soft Contact Measurement,
Fluid Tapping / AC Mode
CB1: 0.3
CB2: 0.08
CB1: 50
CB2: 20
qp-BioAC
(3) cantilevers
YES Biological Applications / Soft Contact Measurement,
Fluid Tapping / AC Mode
CB1: 0.3
CB2: 0.1
CB3: 0.06
CB1: 90
CB2: 50
CB3: 30
qp-BioAC-CI
(3) cantilevers
YES Special tip shape for live cell imaging
Biological Applications / Soft Contact Measurement,
Fluid Tapping / AC Mode
CB1: 0.3
CB2: 0.1
CB3: 0.06
CB1: 90
CB2: 50
CB3: 30
Special qp-fast
(3) cantilevers
YES Fast / High Speed Scanning,
Standard Tapping / NC / AC Mode,
Soft Tapping / NC / AC Mode
CB1: 80
CB2: 30
CB3: 15
CB1: 800
CB2: 420
CB3: 250
qp-HBC
YES Scan Asyst®* Peak Force Tapping® 0.5 60

Platinum Silicide AFM Probes

Platinum Silicide AFM Probes
Platinum Silicide AFM Probes
  • Platinum silicide probe with excellent conductivity and good wear-out behavior
  • Typical tip radius 25 nm
  • Alignment grooves on backside of silicon holder chip
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact PtSi-CONT
YES Electrostatic Force Microscopy / Electrical Measurement,
Long Lifetime / Hardened AC AFM Probes
0.2 13
Non-contact PtSi-NCH
YES Electrostatic Force Microscopy / Electrical Measurement,
Long Lifetime / Hardened AC AFM Probes
42 330
Special PtSi-FM
YES Electrostatic Force Microscopy / Electrical Measurement,
Long Lifetime / Hardened AC AFM Probes
2.8 75

AdvancedTEC™

AdvancedTEC™
AdvancedTEC™
  • Monolithic Silicon-AFM-Probes for very high resolution imaging
  • Fits to all well known AFMs
  • Highly doped single crystal silicon (0.01-0.025 Ohm*cm)
  • Rectangular cantilever with trapezoidal cross section
  • Holder dimensions are 1.6 mm x 3.4 mm
  • REAL TIP VISIBILITY FROM TOP
  • Tip height 15-20 µm
  • Typical tip radius of curvature < 10 nm
  • Aspect Ratio of the last 1.5 µm of the tip > 4:1 (from front and side)
  • Tip shape is defined by real crystal planes resulting in highly reproducible geometries and extremely smooth surfaces
  • Also available with gold or platinum iridium coating
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact ATEC-CONT
NO Contact Mode 0.2 15
ATEC-CONTAu
YES Biological Applications / Soft Contact Measurement,
Electrostatic Force Microscopy / Electrical Measurement
0.2 15
ATEC-CONTPt
YES Electrostatic Force Microscopy / Electrical Measurement 0.2 15
Non-contact ATEC-NC
NO Tapping / NC / AC Mode 45 335
ATEC-NCAu
YES Biological Applications,
Electrostatic Force Microscopy / Electrical Measurement
45 335
ATEC-NCPt
YES Electrostatic Force Microscopy / Electrical Measurement 45 335
Special ATEC-FM
NO Force Modulation Mode 2.8 85
ATEC-FMAu
YES Electrostatic Force Microscopy / Electrical Measurement,
Biological Applications
2.8 85
ATEC-EFM
YES Electrostatic Force Microscopy / Electrical Measurement 2.8 85

PointProbe® Series

PointProbe® Plus
PointProbe® Plus
  • Monolithic Silicon AFM Probes for very high resolution imaging
  • Fits to all well-known AFMs
  • Highly doped single crystal silicon (0.01-0.025 Ohm*cm)
  • Rectangular cantilever with trapezoidal cross section
  • Holder dimensions are 1.6 mm x 3.4 mm
  • Tip radius typically better than 7 nm
  • Improved consistency and resolution
  • Minimized variation in tip shape
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact PPP-CONT
NO Contact mode 0.2 13
PPP-CONTR
YES Contact mode 0.2 13
PPP-CONTSC
NO Contact mode
(short cantilever)
0.2 25
PPP-CONTSCR
YES Contact mode
(short cantilever)
0.2 25
PPP-XYCONTR
YES Contact mode,
XY-Alignment Compatible
0.2 13
PPP-ZEILR
YES Contact mode
(Seiko or Zeiss Veritect)
1.6 27
Non-contact PPP-NCH
NO NC/AC/Tapping Mode,
Vacuum AFM Probes
42 330
PPP-NCHR
YES NC/AC/Tapping Mode,
Vacuum AFM Probes
42 330
PPP-NCL
NO NC/AC/Tapping Mode,
Vacuum AFM Probes
(long cantilever)
48 190
PPP-NCLR
YES NC/AC/Tapping Mode,
Vacuum AFM Probes
(long cantilever)
48 190
PPP-NCST
NO Soft Tapping / NC / AC Mode 7.4 160
PPP-NCSTR
YES Soft Tapping / NC / AC Mode 7.4 160
PPP-QNCHR
YES NC/AC/Tapping Mode,
Vacuum AFM Probes
(high frequency, high quality factor)
42 330
PPP-SEIHR
YES Soft Tapping / NC / AC Mode
(Seiko or Zeiss Veritect)
15 130
PPP-XYNCHR
YES NC/AC/Tapping Mode,
Vacuum AFM Probes,
XY-Alignment Compatible
42 330
PPP-XYNCSTR
YES Soft Tapping / NC / AC Mode,
XY-Alignment Compatible
7.4 160
Special PPP-FM
NO Force Modulation Mode,
Soft Tapping / NC / AC Mode,
Vacuum AFM Probes
2.8 75
PPP-FMR
YES Force Modulation Mode,
Soft Tapping / NC / AC Mode,
Vacuum AFM Probes
2.8 75
PPP-LFMR
YES Contact Mode ,
Lateral / Friction Force Microscopy (LFM)
0.2 23
PPP-QFMR
YES Force Modulation Mode,
Vacuum AFM Probes
(high quality factor)
2.8 75
PointProbe&reg; Plus XY-Alignment
PointProbe® Plus XY-Alignment
  • When used together with the Alignment Chip, probes of three different cantilever lengths (e.g. PPP-NCHR; PPP-XYCONTR and PPP-FMR) can be exchanged without readjustment of the beam deflection laser
  • Monolithic Silicon AFM Probes for very high resolution imaging
  • Fits to all well-known AFMs
  • Highly doped single crystal silicon (0.01-0.025 Ohm*cm)
  • Rectangular cantilever with trapezoidal cross section
  • Tip radius typically better than 7 nm
  • Improved consistency and resolution
  • Minimized variation in tip shape
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact PPP-CONTSC
NO Contact mode
(short cantilever)
0.2 25
PPP-CONTSCR
YES Contact mode
(short cantilever)
0.2 25
PPP-CONTSCAuD
YES Contact mode,
Biological Applications / Soft Contact Measurement
(short cantilever)
0.2 25
PPP-XYCONTR
YES Contact mode,
XY-Alignment Compatible
0.2 13
Non-contact PPP-NCL
NO NC/AC/Tapping Mode,
Vacuum AFM Probes
(long cantilever)
48 190
PPP-NCLAuD
YES NC/AC/Tapping Mode,
Biological Applications / Soft Contact Measurement
(long cantilever)
48 190
PPP-SEIHR
YES Soft Tapping / NC / AC Mode
(Seiko or Zeiss Veritect)
15 130
PPP-XYNCHR
YES NC/AC/Tapping Mode,
Vacuum AFM Probes,
XY-Alignment Compatible
42 330
PPP-XYNCSTR
YES Soft Tapping / NC / AC Mode,
XY-Alignment Compatible
7.4 160
Special PPP-FM
NO Force Modulation Mode,
Soft Tapping / NC / AC Mode,
Vacuum AFM Probes
2.8 75
PPP-FMR
YES Force Modulation Mode,
Soft Tapping / NC / AC Mode,
Vacuum AFM Probes
2.8 75
PPP-LFMR
YES Contact Mode ,
Lateral / Friction Force Microscopy (LFM)
0.2 23
PPP-QFMR
YES Force Modulation Mode,
Vacuum AFM Probes
(high quality factor)
2.8 75
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Non-contact SSS-NCL
NO Enhanced Resolution Tapping / NC / AC AFM probes
(long cantilever)
48 190
SSS-NCLR
YES Enhanced Resolution Tapping / NC / AC AFM probes
(long cantilever)
48 190
SSS-SEIH
NO Enhanced Resolution Tapping / NC / AC AFM probes
(Seiko or Zeiss Veritect)
15 130
SSS-SEIHR
YES Enhanced Resolution Tapping / NC / AC AFM probes
(Seiko or Zeiss Veritect)
15 130
Special SSS-FM
NO Enhanced Resolution Tapping / NC / AC AFM probes 2.8 75
SSS-FMR
YES Enhanced Resolution Tapping / NC / AC AFM probes 2.8 75
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Non-contact AR5-NCLR
YES Trench Measurement
(long cantilever)
48 190
PPP-NCLR
YES NC/AC/Tapping Mode,
Vacuum AFM Probes
(long cantilever)
48 190
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact PPP-CONTSCAu
YES Biological Applications / Soft Contact Measurement,
Electrostatic Force Microscopy / Electrical Measurement
(short cantilever)
0.2 25
PPP-CONTSCPt
YES Electrostatic Force Microscopy / Electrical Measurement
(short cantilever)
0.2 25
Non-contact CDT-NCLR
YES Electrostatic Force Microscopy / Electrical Measurement
(long cantilever)
72 210
DT-NCLR
YES Long Lifetime / Hardened AC AFM Probes,
Nanoindentation
(long cantilever)
72 210
PPP-NCLAu
YES Biological Applications,
Electrostatic Force Microscopy / Electrical Measurement
(long cantilever)
48 190
PPP-NCLPt
YES Electrostatic Force Microscopy / Electrical Measurement
(long cantilever)
48 190
Special CDT-FMR
YES Electrostatic Force Microscopy / Electrical Measurement 6.2 105
DT-FMR
YES Long Lifetime / Hardened AC AFM Probes,
Nanoindentation
6.2 105
PPP-FMAu
YES Biological Applications,
Electrostatic Force Microscopy / Electrical Measurement
2.8 75
PPP-EFM
YES Electrostatic Force Microscopy / Electrical Measurement 2.8 75
PPP-MFMR
YES Magnetic Force Microscopy 2.8 75
PPP-LC-MFMR
YES Magnetic Force Microscopy
(low coercivity)
2.8 75
PPP-LM-MFMR
YES Magnetic Force Microscopy
(low moment)
2.8 75
PPP-QLC-MFMR
YES Magnetic Force Microscopy
(low coercivity, high quality factor)
2.8 75
SSS-MFMR
YES Magnetic Force Microscopy
(high resolution)
2.8 75
SSS-QMFMR
YES Magnetic Force Microscopy
(high resolution, high quality factor)
2.8 75
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Non-contact TL-NCL
NO Tipless Cantilever for Probe Modification
(long cantilever)
48 190
Special TL-FM
NO Tipless Cantilever for Probe Modification 2.8 75
SuperSharpSilicon™
SuperSharpSilicon™
  • For enhances resolution of micro roughness and nanostructures
  • Tip radius is typically better than 2 nm
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Non-contact SSS-NCH
NO Enhanced Resolution Tapping / NC / AC Mode
(high frequency)
42 330
SSS-NCHR
YES Enhanced Resolution Tapping / NC / AC Mode
(high frequency)
42 330
SSS-NCL
NO Enhanced Resolution Tapping / NC / AC Mode
(long cantilever)
48 190
SSS-NCLR
YES Enhanced Resolution Tapping / NC / AC Mode
(long cantilever)
48 190
SSS-SEIH
NO Enhanced Resolution Tapping / NC / AC Mode
(Seiko or Zeiss Veritect)
15 130
SSS-SEIHR
YES Enhanced Resolution Tapping / NC / AC Mode
(Seiko or Zeiss Veritect)
15 130
Special SSS-FM
NO Enhanced Resolution Tapping / NC / AC Mode 2.8 75
SSS-FMR
YES Enhanced Resolution Tapping / NC / AC Mode 2.8 75
SSS-MFMR
YES Magnetic Force Microscopy
(high resolution)
2.8 75
SSS-QMFMR
YES Magnetic Force Microscopy
(high resolution, high quality factor)
2.8 75
High Aspect Ratio Tip
High Aspect Ratio Tip
  • The length of the high aspect portion of the tip is larger than 1.5 µm or 2 µm respectively
  • Special tips are available to compensate the tilt of the scanner-head
  • The tip radii are typically better than 10 nm. We guarantee at least 15 nm
  • The overall tip height is 10 to 15 µm allowing measurements on highly corrugated samples
  • The whole tip as well as the rest of the sensor is fabricated out of one single crystal silicon (monolithic design) resulting in a high lateral stiffness and rigidity
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Non-contact AR10-NCHR
YES Trench Measurement
(high frequency)
42 330
AR10T-NCHR
YES Trench Measurement
(tilt compensated, high frequency)
42 330
AR5-NCH
NO Trench Measurement
(high frequency)
42 330
AR5-NCHR
YES Trench Measurement
(high frequency)
42 330
AR5-NCLR
YES Trench Measurement
(long cantilever)
48 190
AR5T-NCHR
YES Trench Measurement
(tilt compensated, high frequency)
42 330
Rotated Tip
Rotated Tip
  • General data like PointProbe® Plus
  • Tip is rotated 180° with respect to the center axis along the cantilever
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact PPP-RT-CONTR
YES Contact Mode 0.2 13
Non-contact PPP-RT-NCHR
YES Tapping / NC / AC Mode
(high frequency)
42 330
Special PPP-RT-FMR
YES Force Modulation Mode 2.8 75
Tipless Cantilever
Tipless Cantilever
  • no tip
  • highly doped to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact TL-CONT
NO Tipless Cantilever for Probe Modification 0.2 13
Non-contact TL-NCH
NO Tipless Cantilever for Probe Modification
(high frequency)
42 330
TL-NCL
NO Tipless Cantilever for Probe Modification
(long cantilever)
48 190
Special TL-FM
NO Tipless Cantilever for Probe Modification 2.8 75

Plateau Tip

Plateau Tip
Plateau Tip
  • Plateau tip probes with a plateau diameter of 1.8 µm from stock
  • Single crystalline silicon
  • Option to customize plateau diameters
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact PL2-CONT
NO Plateau Tip 0.2 13
PL2-CONTR
YES Plateau Tip 0.2 13
Non-contact PL2-NCH
NO Plateau Tip 42 330
PL2-NCHR
YES Plateau Tip 42 330
PL2-NCL
NO Plateau Tip,
XY Alignment Compatible
(long cantilever)
48 190
PL2-NCLR
YES Plateau Tip,
XY Alignment Compatible
(long cantilever)
48 190
Special PL2-FM
NO Plateau Tip,
XY Alignment Compatible
2.8 75
PL2-FMR
YES Plateau Tip,
XY Alignment Compatible
2.8 75

Coated AFM Probes

Gold coated
Gold coated
  • 70 nm thick gold coating on detector side of the cantilever
  • 70 nm thick gold coating on both sides of the cantilever
  • Metallic conductivity of the tip
  • Detector side coating enhances the reflectivity of the laser beam
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact ATEC-CONTAu
YES Biological Applications / Soft Contact Measurement,
Electrostatic Force Microscopy / Electrical Measurement

0.2 15
Non-contact ATEC-NCAu
YES Biological Applications,
Electrostatic Force Microscopy / Electrical Measurement
45 335
Special ATEC-FMAu
YES Electrostatic Force Microscopy / Electrical Measurement,
Biological Applications
2.8 85
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact PPP-CONTAu
YES Contact Mode,
Biological Applications / Soft Contact Measurement,
Electrostatic Force Microscopy / Electrical Measurement
0.2 13
PPP-CONTAuD
YES Contact Mode,
Biological Applications / Soft Contact Measurement
0.2 13
Non-contact PPP-NCHAu
YES Biological Applications,
Electrostatic Force Microscopy / Electrical Measurement
(high frequency)
42 330
PPP-NCHAuD
YES Tapping / NC / AC Mode,
Biological Applications
(high frequency)
42 330
PPP-NCLAu
YES Biological Applications,
Electrostatic Force Microscopy / Electrical Measurement
(long cantilever))
48 190
PPP-NCLAuD
YES Tapping / NC / AC Mode,
Biological Applications
(long cantilever)
48 190
PPP-NCSTAu
YES Biological Applications,
Electrostatic Force Microscopy / Electrical Measurement
7.4 160
PPP-NCSTAuD
YES Soft Tapping / NC / AC Mode,
Biological Applications
7.4 160
Special PPP-FMAu
YES Biological Applications,
Electrostatic Force Microscopy / Electrical Measurement
2.8 75
PPP-FMAuD
YES Force Modulation Mode,
Biological Applications
2.8 75
Diamond coated
Diamond coated
  • 100 nm thick coating of polycrystalline diamond on the tip side
  • 200 nm thick coating of polycrystalline diamond on the tip side
  • Unsurpassed hardness of the tip
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact CDT-CONTR
YES Electrostatic Force Microscopy / Electrical Measurement 0.5 20
DT-CONTR
YES Long Lifetime / Hardened AC AFM Probes,
Nanoindentation
0.5 20
Non-contact CDT-NCHR
YES Electrostatic Force Microscopy / Electrical Measurement
(high frequency)
80 400
DT-NCHR
YES Long Lifetime / Hardened AC AFM Probes,
Nanoindentation
(high frequency)
80 400
CDT-NCLR
YES Electrostatic Force Microscopy / Electrical Measurement
(long cantilever)
72 210
DT-NCLR
YES Long Lifetime / Hardened AC AFM Probes,
Nanoindentation
(long cantilever)
72 210
Special CDT-FMR
YES Electrostatic Force Microscopy / Electrical Measurement 6.2 105
DT-FMR
YES Long Lifetime / Hardened AC AFM Probes,
Nanoindentation
6.2 105
Platinum-Iridium coated
Platinum-Iridium coated
  • 25 nm thick layer of chromium and platinum iridium
  • Coating on both sides of the cantilever
  • Allows electrical measurements
  • Detector side coating enhances the reflectivity of the laser beam by a factor of 2
  • Stress compensated and wear resistant
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact ATEC-CONTPt
YES Electrostatic Force Microscopy / Electrical Measurement 0.2 15
Non-contact ATEC-NCPt
YES Electrostatic Force Microscopy / Electrical Measurement 45 335
Special ATEC-EFM
YES Electrostatic Force Microscopy / Electrical Measurement 2.8 85
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact PPP-CONTPt
YES Electrostatic Force Microscopy / Electrical Measurement 0.2 13
PPP-CONTSCPt
YES Electrostatic Force Microscopy / Electrical Measurement
(short cantilever)
0.2 25
Non-contact PPP-NCHPt
YES Electrostatic Force Microscopy / Electrical Measurement
(high frequency)
42 330
PPP-NCLPt
YES Electrostatic Force Microscopy / Electrical Measurement
(long cantilever)
48 190
PPP-NCSTPt
YES Electrostatic Force Microscopy / Electrical Measurement 7.4 160
Special PPP-EFM
YES Electrostatic Force Microscopy / Electrical Measurement 2.8 75
Magnetic Coated
Magnetic Coated
  • Hard magnetic coating on the tip side (coercivity between 0.75 and 300 Oe, remanence magnetization between 80 and 300 emu/cm³)
  • Effective magnetic moment between 2.5 and 13 emu
  • Metallic electrical conductivity
  • Lowest possible guaranteed tip radius of curvature down to < 15 nm
  • Highest possible magnetic resolution better than 25 nm
  • Al coating on detector side of cantilever enhancing the reflectivity of the laser beam by a factor of about 2.5
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Special PPP-MFMR
YES Magnetic Force Microscopy 2.8 75
PPP-LC-MFMR
YES Magnetic Force Microscopy
(low coercivity)
2.8 75
PPP-LM-MFMR
YES Magnetic Force Microscopy
(low moment)
2.8 75
PPP-QLC-MFMR
YES Magnetic Force Microscopy
(low coercivity, high quality factor)
2.8 75
SSS-MFMR
YES Magnetic Force Microscopy
(high resolution)
2.8 75
SSS-QMFMR
YES Magnetic Force Microscopy
(high resolution, high quality factor)
2.8 75

Self-sensing + Self-actuating

Self-sensing + Self-actuating
Self-sensing + Self-actuating

Akiyama-Probe is based on a quartz tuning fork combined with a micromachined cantilever. The great advantage of this novel probe is that one can benefit from both the tuning fork’s extremely stable oscillation and the silicon cantilever’s reasonable spring constant with one probe.
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Special Akiyama-Probe
NO Self-sensing + self-actuating 5 50

Special Developments List

Special Developments List
Special Developments List

Examples of our Special Developments are:

  • Plateau tips with a customized diameter
  • Rounded tips
  • Sphere tips
  • Platinium Iridium or Gold coating with different thicknesses on various probe types
  • Backside Gold and tipside Nitride coating
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact Special Developments List
NO

Metrology Standards

Metrology Standards
Metrology Standards

In close cooperation with national technical authorities for metrology in Europe, NANOSENSORS™ has developed a set of calibration standards for SPM applications. These standards allow the calibration of the X,Y and Z axis of an SPM machine. In addition certain system induced limitations of such apparatus can be revealed and compensated.

2D Pitch Standard TYPE: 2D200
The German PTB (Physikalisch Technische Bundesanstalt), Great Britain NPL (National Physical Laboratory) and the Danish Institute of Fundamental Metrology (DFM) participated not only in the product definition phase. Their main task was the development of measurement technology for calibrating the standards. These institutions ensure the traceability not only to national standards. Through european (EUROMET) and international cooperations (Metre Convention) traceability to other worldwide metrology standards is achieved.

Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]