PPP-FMAuD

PointProbe® Plus Force Modulation Mode - Au coating (Detector side)

The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-FMAuD is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The probe offers unique features:

  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • Au coating on detector side of cantilever
  • chemically inert

A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

How to optimize AFM scanning parameters: list-img
Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 75 45 - 115
Force Constant [N/m] 2.8 0.5 - 9.5
Length [µm] 225 215 - 235
Mean Width [µm] 28 20 - 35
Thickness [µm] 3 2 - 4
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-FMAuD-10 10 of all probes
NANOSENSORS™ PointProbe® Plus AFM Probes