NANOSENSORS AFM probes for Magnetic Force Microscopy

Did you know that NANOSENSORS offers six different types of AFM probes for Magnetic Force Microscopy ( MFM) for scanning and investigating sample surfaces with magnetic features?

PPP-MFMR – AFM tip with hard magnetic coating, sensitivity, resolution and coercivity designed for standard magnetic force microscopy applications

PPP-LM-MFMR – designed for magnetic force microscopy with reduced disturbance of the magnetic sample by the MFM tip and enhanced lateral resolution

PPP-LC-MFMR –  MFM tip with soft magnetic coating designed for the measurement of magnetic domains in soft magnetic samples

PPP-QLC-MFMR –  low coercivity MFM probe designed for high operation stability and low disturbance of magnetic samples under ultrahigh vacuum ( UHV ) conditions

SSS-MFMR – SuperSharp MFM probe for high resolution magnetic force imaging, low magnetic moment for reduced disturbance of soft magnetic samples

SSS-QMFMR – SuperSharp MFM probe for high resolution magnetic force imaging with a high mechanical Q-factor for applications in ultrahigh vacuum ( UHV ) .

The screencast introducing all these different MFM probes, their properties and their applications held by our Head of R&D Thomas Sulzbach has just passed the 1500 views mark. Congratulations Thomas!

NANOSENSORS AFM tips for Magnetic Force Microscopy

For further details please have a look at the NANOSENSORS MFM probes brochure.

Application examples for NANOSENSORS AFM probes for Magnetic Force Microscopy can be found in the NANOSENSORS blog.

NANOSENSORS screencasts on Magnetic Force Microscopy AFM probes are also available in

Chinese

on youku http://v.youku.com/v_show/id_XNzMyMDg2MjQ4.html

and Youtube

and

Japanese

On the magnetic nanostructure of a Co–Cu alloy processed by high-pressure torsion

Lately the production of nanocrystalline magnetic materials starting with coarse grained materials (top-down approach) has received increasing interest.*

The advantage of the top-down approach compared to the bottom-up approach ( e.g. using melt spinning, stacking of sheets, annealing treatments and other processing steps) is that rare-earth elements and additional processing steps such as stacking of sheets are not necessary.*

In the article “On the magnetic nanostructure of a Co–Cu alloy processed by high-pressure torsion” Martin Stückler, Christian Teichert, Aleksandar Matković, Heinz Krenn, Lukas Weissitsch, Stefan Wurster, Reinhard Pippan, Andrea Bachmaier present a preparation route of Co–Cu alloys with soft magnetic properties by high-pressure torsion deformation. Nanocrystalline, supersaturated single-phase microstructures are obtained after deformation of Co–Cu alloys, which are prepared from an initial powder mixture with Co-contents above 70 wt.%.*

The authors used NANOSENSORS SSS-MFMR magnetic AFM probes optimized for high resolution magnetic force imaging in the quantitative analysis of the magnetic microstructure by magnetic force microscopy to understand the measured magnetic properties and correlated this to the detected changes in coercivity.

The achieved results by Martin Stückler et al. show that the rising coercivity can be explained by a magnetic hardening effect occurring in context with spinodal decomposition.*

Fig. 6 from “On the magnetic nanostructure of a Co–Cu alloy processed by high-pressure torsion” by Martin Stückler et al.:
2 μm × 2 μm AFM scans of (a) as-deformed state and (c) 300 °C annealed state. The corresponding MFM scans of the as-deformed and 300 °C annealed state are shown in (b) and (d) respectively. The axial direction of the HPT specimen points out of the plane, the shear direction is in horizontal direction. The lateral scale bar in (a) applies to all scans. The minimum height and phase signal values are shifted to zero for visualization purposes.
NANOSENSORS SSS-MFMR magnetic AFM probes optimized for high resolution magnetic force microscopy were used
Fig. 6 from “On the magnetic nanostructure of a Co–Cu alloy processed by high-pressure torsion” by Martin Stückler et al.:
2 μm × 2 μm AFM scans of (a) as-deformed state and (c) 300 °C annealed state. The corresponding MFM scans of the as-deformed and 300 °C annealed state are shown in (b) and (d) respectively. The axial direction of the HPT specimen points out of the plane, the shear direction is in horizontal direction. The lateral scale bar in (a) applies to all scans. The minimum height and phase signal values are shifted to zero for visualization purposes.

*Martin Stückler, Christian Teichert, Aleksandar Matković, Heinz Krenn, Lukas Weissitsch, Stefan Wurster, Reinhard Pippan, Andrea Bachmaier
On the magnetic nanostructure of a Co–Cu alloy processed by high-pressure torsion
Journal of Science: Advanced Materials and Devices, Volume 6, Issue 1, March 2021, Pages 33-41
DOI: https://doi.org/10.1016/j.jsamd.2020.09.013

Please follow this external link to read the full article: https://www.sciencedirect.com/science/article/pii/S2468217920300873?via%3Dihub

Open Access The article “On the magnetic nanostructure of a Co–Cu alloy processed by high-pressure torsion” by Martin Stückler, Christian Teichert, Aleksandar Matković, Heinz Krenn, Lukas Weissitsch, Stefan Wurster, Reinhard Pippan, Andrea Bachmaier is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

Two New MSS Sensors for Torque Magnetometry added to Special Developments List

NANOSENSORS™ has completed the development of two additional Membrane-type Surface-stress Sensors (MSS) ( SD-MSS-1KPMAl and SD-MSS-1KPMAu ) dedicated for torque magnetometry.

Torque magnetometry is a useful technique often employed for assessment of various materials like organic conductors, magnetic and superconductor materials.

Now NANOSENSORS™ has added two new types of MSS for this application “SD-MSS-1KPMAl” and “SD-MSS-1KPMAu” to the NANOSENSORS™Special Developments List.

These sensors can be used for nanomechanical sensing, material assessment, static/pulsed-field torque magnetometry, force sensing, and other applications.

The new sensor chips share the common MSS features, i.e., a membrane (or platform) supported with four beams on which piezoresistors are embedded at the fixed ends.

In the newly developed sensor chips however, the sensing beams are longer than in MSS chips meant for odour sensing applications (SD-MSS-1K2G) and form “bending” and “torsional” axes.

There are now three types of Membrane-type Surface-stress Sensor (MSS) dedicated for torque magnetometry available.

All three have in common that for two different functional axes, differently designed piezoresistors are embedded to effectively sense the torque generated by the sample. Considering a use at cryogenic temperatures, the resistance of the piezoresistor is designed relatively low and in the range of 0.3 – 1.2 kΩ. Each piezoresistor can be individually connected so that various measurement configurations can be arranged by the user.

Compared to the conventionally used piezoresistive cantilevers, the new types of Membrane-type Surface-stress Sensor “SD-MSS-1KTM, SD-MSS-1KPMAl and SD-MSS-1KPMAu ) have many advantages:

  • easier to handle the chip
  • relatively robust structure
  • larger sample capability, etc.,

all of which facilitate preparations of measurement setup and increase turnaround of material assessment.

The chip dimension of the newly added SD-MSS-1KPMAl and SD-MSS-1KPMAu are 3.0 x 2.0 x 0.3 mm.

Compared to SD-MSS-1KTM two piezoresistive cantilevers and a coil are additionally integrated in SD-MSS-1KPMAl and SD-MSS-1KPMAu.

The SD-MSS-1KPMAl’s electric configuration features Aluminum pads for wire bonding or gluing.

NANOSENSORS Membrane-type Surface-stress Sensor MSS for torque magnetometry SD-MSS-1KPMAl . Newly added to the NANOSENSORS Special Developments List.
NANOSENSORS Membrane-type Surface-stress Sensor MSS for torque magnetometry SD-MSS-1KPMAl ( with Aluminum pads )

The SD-MSS-1KPMAu’s electric configuration features Gold pads for wire bonding or gluing.

NANOSENSORS Membrane-type Surface-stress Sensor MSS for torque magnetometry SD-MSS-1KPMAu . Newly added to the NANOSENSORS Special Developments List
NANOSENSORS Membrane-type Surface-stress Sensor MSS for torque magnetometry SD-MSS-1KPMAu ( with gold pads )

For further technical information, price or delivery times please contact us at info(at)nanosensors.com