SPM cantilevers

Akiyama-Probe (A-Probe) Motion Video

by NANOSENSORS
7 February 202215 March 2023
Videos

Do you want to find out how the NANOSENSORS self-sensing and self-actuating Akiyama Probe (A-Probe) works? Then have a look at this video with its… Read More »Akiyama-Probe (A-Probe) Motion Video

Happy New Lunar Year!

by NANOSENSORS
31 January 202215 March 2023
News & Events

NANOSENSORS AFM probes lunar new year image 2022. A shilouette of a tiger waling through a forest

We wish everyone a good start into the year of the tiger!

Calibration Service for AFM Cantilevers

by NANOSENSORS
26 January 202215 March 2023
Inside NANOSENSORS, Videos

The NANOSENSORS screencast on the calibration service for AFM cantilevers has just reached the 1500 views mark. Accurately determined AFM cantilever properties are very important… Read More »Calibration Service for AFM Cantilevers

Multi-Channel Exploration of O Adatom on TiO2(110) Surface by Scanning Probe Microscopy

by NANOSENSORS
5 October 202015 March 2023
Science & Technology

Figure 5. from “Multiple images of TiO2(110) surface with atomic resolution and corresponding line profiles” by Huan Fei Wen et al. (a) Frequency shift (∆f) image, (b) tunneling current () image and (c) local contact potential difference (VLCPD) image. (d,e) The line profiles along the blue line on the surface in (b,c). (f0 = 805 kHz, Q = 27623, ∆f = −260 Hz, VDC = 1.3 V, VAC = 1.5 V, A = 500 pm, size: 3.5 × 3.2 nm2). Multiple images of TiO2(110) surface with atomic resolution and corresponding line profiles. (a) Frequency shift (∆f) image, (b) tunneling current () image and (c) local contact potential difference (VLCPD) image. (d,e) The line profiles along the blue line on the surface in (b,c). (f0 = 805 kHz, Q = 27623, ∆f = −260 Hz, VDC = 1.3 V, VAC = 1.5 V, A = 500 pm, size: 3.5 × 3.2 nm2). - Ultrastiff NANOSENSORS SD-T10L100 AFM probes were used.

In the article “Multi-Channel Exploration of O Adatom on TiO2(110) Surface by Scanning Probe Microscopy” Huan Fei Wen, Yasuhiro Sugawara and Yan Jun describe how… Read More »Multi-Channel Exploration of O Adatom on TiO2(110) Surface by Scanning Probe Microscopy

Happy Swiss National Holiday with Smallest Swiss Cross

by NANOSENSORS
1 August 202015 March 2023
News & Events

Basel University : Smallest Swiss Cross – Made of 20 Single Atoms ( a NANOSENSORS PointProbePlus PPP-NCL AFM probe was used for this image)

Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences

by NANOSENSORS
9 June 202015 March 2023
Science & Technology

Figure 4 a and b from Ana I. Gómez-Varela et al “Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences : Simultaneous SR-SIM/AFM acquisition. The AFM measurements were carried out on fixed U2OS cells in medium/buffer with (a) and without N-SIM illumination (b). For convenience and enhanced feature/noise contrast, both AFM topography images in the SR-SIM/AFM overlays are displayed with an edge detection algorithm using a pixel difference operator in X. The topography images from Petri dish surface on three positions (labelled in the figures) were planefit (1st order polynomial function) to compensate for tilts in the sample surface, and subjected to surface roughness analysis Please have a look at the full article to view the full figure. https://rdcu.be/b4Iot

Correlating data from different microscopy techniques holds the potential to discover new facets of signalling events in cellular biology.* In the article “Simultaneous co-localized super-resolution… Read More »Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences

Consistent AFM tip shape leading to reproducible results – NANOSENSORS PointProbe® Plus Screencast passes 1000 views mark

by NANOSENSORS
26 March 202015 March 2023
Videos

The screencast held by Head of R&D Thomas Sulzbach on the NANOSENSORS PointProbe® Plus Silicon AFM probe series with a consistent tip shape leading to… Read More »Consistent AFM tip shape leading to reproducible results – NANOSENSORS PointProbe® Plus Screencast passes 1000 views mark