Tag Archives: AFM Tips

Soft, drift-reduced AFM cantilevers for Biology and Life Sciences – Uniqprobe Screencast passes the 1000 views mark

The screencast on the soft, drift-reduced NANOSENSORS™ uniqprobe cantilevers for biology and life science applications held by Dr. Laure Aeschimann has just passed the 1000 views mark. Congratulations Laure!

Since the first publication of this screencast that presents the uniqprobe types qp-BioAC, qp-BioT, qp-SCONT and qp-CONT , three further types of uniqprobe AFM probes have been introduced:

qp-BioAC-CI – a version of uniqprobe™ BioAC with Rounded Tips for Cell Imaging

qp-fast – three different uniqprobe™ cantilevers on one support chip for Soft- , Standard- , Fast Tapping/Dynamic AFM Imaging

and qp-HBC – the uniqprobe™ – HeartBeatCantilever that can also be used for ScanAsyst** and Peak Force Tapping** in Air.

To find out more please have a look at the NANOSENSORS™ uniqprobe brochure or the individual product pages on the NANOSENSORS webpage.

Additionally we have also put tipless versions of the qp-SCONT, qp-CONT and the qp-BioT ( SD-qp-BioT-TL, SD-qp-CONT-TL, SD-qp-SCONT-TL) and uniqprobe tipless cantilever arrays ( SD-qp-TL8a and SD-qp-TL8b ) on the NANOSENSORS special developments list.

Feel free to browse or let us know if you have any questions via info(at)nanosensors.com.

Product Screencast on the NANOSENSORS™ uniqprobe AFM Probes series with unsurpassed small variation in spring constant and resonance frequency by product developer Dr. Laure Aeschimann

A Japaneseversion of the screencast is also available :

バイオテクノロジー/ライフサイエンス向け NANOSENSORS ユニーク·プローブ Uniqprobe

A Chinese version of the Uniqprobe screencast is available on three different channels:

NANOSENSORS公司的吴烨娴博士在本视频中介绍了Uniqprobe原子力显微镜探针。Uniqprobe 探针 的悬臂梁厚度均一,并且有局部的金反射涂层。这两个特点使得这个探针在一些对弹性系数有精确要求的应用中, 表现出卓越的机械性能一致性 。该探针特别适用于分子生物学,生物物理学和定量纳米机械的研究.

The Chinese version is also available on Youku: http://v.youku.com/v_show/id_XNzA4MTgxNTI4.html
or weibo http://weibo.com/u/5077581192?is_all=1

** ScanAsyst® and PeakForce Tapping™ are trademarks of Bruker Corp.

Happy Swiss National Holiday with Smallest Swiss Cross

Basel University : Smallest Swiss Cross – Made of 20 Single Atoms ( a NANOSENSORS PointProbePlus PPP-NCL AFM probe was used for this image)

20 bromine atoms positioned on a sodium chloride surface using the tip of an atomic force microscope at room temperature, creating a Swiss cross with the size of 5.6nm. The structure is stable at room temperature and was achieved by exchanging chlorine with bromine atoms. (Fig: University of Basel, Department of Physics) The image was taken using a NANOSENSORS PointProbePlus PPP-NCL AFM probe
20 bromine atoms positioned on a sodium chloride surface using the tip of an atomic force microscope at room temperature, creating a Swiss cross with the size of 5.6nm. The structure is stable at room temperature and was achieved by exchanging chlorine with bromine atoms. (Fig: University of Basel, Department of Physics)

Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy

In the article «Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy» Kohei Ono, Yuki Mizushima, Masaki Furuya, Ryota Kunihisa, Nozomu Tsuchiya, Takeshi Fukuma, Ayumi Iwata and Atsushi Matsuki describe a new method, namely, force–distance curve mapping, that was developed to directly measure the adhesion force of individual aerosol particles by atomic force microscopy.*

The proposed method collects adhesion force from multiple points on a single particle. It also takes into account the spatial distribution of the adhesion force affected by topography (e.g., the variation in the tip angle relative to the surface, as well as the force imposed upon contact), thereby enabling the direct and quantitative measurement of the adhesion force representing each particle.*

The results presented in the article highlight that the original chemical composition, as well as the aging process in the atmosphere, can create significant variation in the adhesion force among individual particles. This study demonstrates that force–distance curve mapping can be used as a new tool to quantitatively characterize the physical properties of aerosol particles on an individual basis.*

The measurement of adhesion force described in the article was performed in contact mode using silicon NANOSENSORS™ AdvancedTEC™ ATEC-CONT AFM tips.*

Figure 2 from «Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy» by Kohei Ono et al:
Atomic force microscopy (AFM) mag image (a), slope mapping (b), and adhesion force mapping (c) obtained from the same 1 μm PSL particle. Representative force–distance curves are shown for the point at which the tip is properly in contact with the surface with sufficient stroke (loading force), at the proper angle (d) and for the point further towards the edge where the tip is barely touching the surface at a steep angle (e). The black lines in panels (d) and (e) show the baseline in which the tip did not touch the particle or substrate. A plot of the relationship between the slope and the adhesion force is shown in panel (f). The plots in the shaded area are considered to represent the adhesion force of the particle.
Figure 2 from «Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy» byKohei Ono et al:
Atomic force microscopy (AFM) mag image (a), slope mapping (b), and adhesion force mapping (c) obtained from the same 1 μm PSL particle. Representative force–distance curves are shown for the point at which the tip is properly in contact with the surface with sufficient stroke (loading force), at the proper angle (d) and for the point further towards the edge where the tip is barely touching the surface at a steep angle (e). The black lines in panels (d) and (e) show the baseline in which the tip did not touch the particle or substrate. A plot of the relationship between the slope and the adhesion force is shown in panel (f). The plots in the shaded area are considered to represent the adhesion force of the particle.

*Kohei Ono, Yuki Mizushima, Masaki Furuya, Ryota Kunihisa, Nozomu Tsuchiya,Takeshi Fukuma, Ayumi Iwata and Atsushi Matsuki
Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy
Atmosphere 2020, 11(5), 489
DOI: https://doi.org/10.3390/atmos11050489

Please follow this external link to read the full article: https://www.mdpi.com/2073-4433/11/5/489/htm

Open Access: The article “Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy” by Kohei Ono, Yuki Mizushima, Masaki Furuya, Ryota Kunihisa, Nozomu Tsuchiya,Takeshi Fukuma, Ayumi Iwata and Atsushi Matsuki is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.