March 2021

Name: Product Screencast NANOSENSORS™ Magnetic Force Microscopy probes
Uploaded: 2014-02-18T00:00:00+00:00
Duration: 13 min 10 s
Description: Product Screencast on the NANOSENSORS™ Magnetic Force Microscopy Silicon MFM Probes held by head of R&D Thomas Sulzbach. http://www.nanosensors.comhttp://www...

NANOSENSORS AFM probes for Magnetic Force Microscopy

by NANOSENSORS
31 March 202115 March 2023
News & Events, Videos

Did you know that NANOSENSORS offers six different types of AFM probes for Magnetic Force Microscopy ( MFM) for scanning and investigating sample surfaces with…

by NANOSENSORS
25 March 202115 March 2023
Science & Technology

Fig. 6 from “On the magnetic nanostructure of a Co–Cu alloy processed by high-pressure torsion” by Martin Stückler et al.: 2 μm × 2 μm AFM scans of (a) as-deformed state and (c) 300 °C annealed state. The corresponding MFM scans of the as-deformed and 300 °C annealed state are shown in (b) and (d) respectively. The axial direction of the HPT specimen points out of the plane, the shear direction is in horizontal direction. The lateral scale bar in (a) applies to all scans. The minimum height and phase signal values are shifted to zero for visualization purposes. NANOSENSORS SSS-MFMR magnetic AFM probes optimized for high resolution magnetic force microscopy were used

Lately the production of nanocrystalline magnetic materials starting with coarse grained materials (top-down approach) has received increasing interest.* The advantage of the top-down approach compared…

March 2021

NANOSENSORS AFM probes for Magnetic Force Microscopy

On the magnetic nanostructure of a Co–Cu alloy processed by high-pressure torsion