Tag Archives: tip view AFM probes

On-chip integration of single solid-state quantum emitters with a SiO2 photonic platform

One important building block for future integrated nanophotonic devices is the scalable on-chip interfacing of single photon emitters and quantum memories with single optical modes.*

In the article “On-chip integration of single solid-state quantum emitters with a SiO2 photonic platform” Florian Böhm, Niko Nikolay, Christoph Pyrlik, Jan Schlegel, Andreas Thies, Andreas Wicht,Günther Tränkle and Oliver Benson present the deterministic integration of a single solid-state qubit, the nitrogen-vacancy (NV) center, with a photonic platform consisting exclusively of SiO2grown thermally on a Si substrate.*
The platform stands out by its ultra-low fluorescence and the ability to produce various passive structures such as high-Q micro resonators and mode-size converters. By numerical analysis an optimal structure for the efficient coupling of a dipole emitter to the guided mode could be determined. Experimentally, the integration of a preselected NV emitter was performed with an atomic force microscope and the on-chip excitation of the quantum emitter as well as the coupling of single photons to the guided mode of the integrated structure could be demonstrated. The authors approach shows the potential of this platform as a robust nanoscale interface of on-chip photonic structures with solid-state qubits.*

After optically verifying the successful placement of the nanodiamond hosting a single nitrogen-vacancy ( NV ) center by performing a confocal scan, the article describes how the nanoparticle is pushed to the inner edge of the rib waveguide in a subsequent step, using a NANOSENSORS™ AdvancedTEC™ ATEC-NC tip-view AFM probe.*


Figure 1 a from: “On-chip integration of single solid-state quantum emitters with aSiO2photonic platform” by Florian Böhm et al:
Waveguide design and functionalization
(a) Illustration of the SiO2waveguide structure and the field profile(E2∣∣)of the guided TM fundamental optical mode at 700 nm. Also the deterministic positioning process of the diamond-nanocrystal containing a single NV center (the NV crystal structure is shown in the inset) into the inner edge of the integrated SiO2rib waveguide with an atomic force microscope (AFM) tip, is shown.

*Florian Böhm, Niko Nikolay, Christoph Pyrlik, Jan Schlegel, Andreas Thies, Andreas Wicht,Günther Tränkle and Oliver Benson
On-chip integration of single solid-state quantum emitters with a SiO2 photonic platform
New Journal of Physics 21 (2019 ) 045007
DOI: https://iopscience.iop.org/article/10.1088/1367-2630/ab1144

Please follow this external link to read the full article: https://iopscience.iop.org/article/10.1088/1367-2630/ab1144/pdf

Open Access: The article “On-chip integration of single solid-state quantum emitters with a SiO2 photonic platform” by Florian Böhm, Niko Nikolay, Christoph Pyrlik, Jan Schlegel, Andreas Thies, Andreas Wicht, Günther Tränkle and Oliver Benson is licensed under a Creative Commons Attribution 3.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/3.0/.

Visualizing the bidirectional optical transfer function for near-field enhancement in waveguide coupled plasmonic transducers

In their article “Visualizing the bidirectional optical transfer function for near-field enhancement in waveguide coupled plasmonic transducers” Lauren M. Otto, D. Frank Ogletree, Shaul Aloni, Matteo Staffaroni, Barry C. Stipe and Aeron T. Hammack describe how visualizations of the near-field modes in the region of a plasmonic device were created using scattering scanning near-field optical microscopy and scanning electron microscopy cathodoluminescence with both showing a strong correspondence to multiphysical numerical modeling of the devices under interrogation.

The sSNOM measurements shown in this article were performed with NANOSENSORS™ AdvancedTEC™ ATEC-NC tip-view AFM probes.

Figure 3 from «Visualizing the bidirectional optical transfer function for near-field enhancement in waveguide coupled plasmonic transducers» by Lauren M. Otto et al.:
Scattering scanning near-field optical microscopy images of HAMR heads as a function of wavelength and polarization. Near-field maps for the 1ω0 and 6ω0 with both (a) 830 nm and (b) 633 nm wavelengths as well as polarizations ranging from −90° deg (perp, TE) to 0° (para TM) to +90° (perp, TE). All maps are 400 nm × 400 nm. The intensity maxima from all maps were extracted and plotted against the expected cos2(θ) intensity decay curve for both (c) 830 nm light and (d) 633 nm light. The full data set ranged from −100° to 100° in increments of 10° and covered six harmonics for both wavelengths. The AFM color scale ranges from −3.8 to +1.6 nm, and the map is 400 nm × 400 nm. Additional images can be found in the Supporting Information in the online version of the original article.

Lauren M. Otto, D. Frank Ogletree, Shaul Aloni, Matteo Staffaroni, Barry C. Stipe and Aeron T. Hammack
Visualizing the bidirectional optical transfer function for near-field enhancement in waveguide coupled plasmonic transducers
Nature Scientific Reports volume 8, Article number: 5761 (2018)
DOI: https://doi.org/10.1038/s41598-018-24061-3

Please follow this external link to read the full article: https://rdcu.be/bU4co

Open Access: The article “Visualizing the bidirectional optical transfer function for near-field enhancement in waveguide coupled plasmonic transducers” by Lauren M. Otto, D. Frank Ogletree, Shaul Aloni, Matteo Staffaroni, Barry C. Stipe and Aeron T. Hammack which is cited above is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

High-resolution imaging of graphene by tip-enhanced coherent anti-Stokes Raman scattering

In their research article “High-resolution imaging of graphene by tip-enhanced coherent anti-Stokes Raman scattering” Xiaolong Kou, Qian Zhou, Dong Wang, Jinghe Yuan, Xiaohong Fang and Lijun Wan report how they achieved the first single atom layer TECARS (tip-enhanced coherent anti-Stokes Raman scattering ) imaging on Graphene with the highest resolution about 20nm.*

The authors used a NANOSENSORS AdvancedTEC™ ATEC-NC AFM tip that they coated with a 20nm Au coating by E-beam evaporation.

With some technological improvements TECARS imaging could be a promising tool for the study of the biochemistry of materials and live cells at the molecular and subcellular levels without labelling as well as other biological, chemical and medical applications.*

Fig. 6. from “High-resolution imaging of graphene by tip-enhanced coherent anti-Stokes Raman scattering “ by Xiaolong Kou  et al. (a) TECARS imaging of graphene. (b) Signal intensity measurement of the yellow line in (a). First single atom layer TECARS (tip-enhanced coherent anti-Stokes Raman scattering ) imaging on Graphene with the highest resolution about 20nm

Fig. 6. from “High-resolution imaging of graphene by tip-enhanced coherent anti-Stokes Raman scattering “ by Xiaolong Kou  et al. :
(a) TECARS imaging of graphene. (b) Signal intensity measurement of the yellow line in (a).

*Xiaolong Kou, Qian Zhou, Dong Wang, Jinghe Yuan, Xiaohong Fang, Lijun Wan
High-resolution imaging of graphene by tip-enhanced coherent anti-Stokes Raman scattering
Journal of Innovative Optical Health Sciences, Vol. 12, No. 01, 1841003 (2019)
DOI: https://doi.org/10.1142/S1793545818410031

Please follow this external link for the full research article: https://www.worldscientific.com/doi/full/10.1142/S1793545818410031

Open Access The article “High-resolution imaging of graphene by tip-enhanced coherent anti-Stokes Raman scattering” by Xiaolong Kou, Qian Zhou, Dong Wang, Jinghe Yuan, Xiaohong Fang and Lijun Wan is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/