AFM probes for high resolution imaging – NANOSENSORS SuperSharpSilicon™ series video reaches 500 views mark

The NANOSENSORS screencast on SuperSharpSilicon™ AFM probes for high resolution imaging held by Dr. Oliver Krause just passed the 500 views mark. Congratulations Oliver!

NANOSENSORS™ SuperSharpSilicon™ High Resolution AFM Probes are designed for measurements with enhanced resolution of nanostructures and microroughnesses. They are realised by a unique AFM tip manufacturing process leading to a further improvement of the AFM tip sharpness with AFM tip radii typically as low as 2 nm.

NANOSENSORS™ SuperSharpSilicon™ AFM probes are available on four different AFM cantilever types covering non-contact, acoustic or tapping mode applications as well as force modulation techniques. They are also optionally available with a magnetic coating on the AFM tip. Please have a look at the overview below.

Type Reflective coating Application Force constant [N/m]
Resonance frequency [kHz]
Non-Contact SSS-NCH NO Enhanced Resolution Tapping / NC / AC Mode

(high frequency)

42 330
SSS-NCHR YES Enhanced Resolution Tapping / NC / AC Mode

(high frequency)

42 330
SSS-NCL NO Enhanced Resolution Tapping / NC / AC Mode

(long AFM cantilever)

48 190
SSS-NCLR YES Enhanced Resolution Tapping / NC / AC Mode

(long AFM cantilever)

48 190
SSS-SEIH NO Enhanced Resolution Soft-Tapping / NC / AC Mode

(originally designed for Seiko or Zeiss Veritect but can also be used in most other commercially available AFMs)

15 130
SSS-SEIHR YES Enhanced Resolution Soft-Tapping / NC / AC Mode

(originally designed for Seiko or Zeiss Veritect but can also be used in most other commercially available AFMs)

15 130
SSS-FM NO Enhanced Resolution Tapping / NC / AC Mode 2.8 75
SSS-FMR YES Enhanced Resolution Tapping / NC / AC Mode 2.8 75
SSS-MFMR YES Magnetic Force Microscopy

(high resolution)

2.8 75
SSS-QMFMR YES               Magnetic Force Microscopy

(high resolution, high quality factor)

2.8 75

 

The AFM probes of the SuperSharpSilicon™ series have stayed popular among researchers ever since their introduction and have contributed to research results presented in many published papers. You will find some literature references below. These references are just random examples. Many more published papers mentioning the use of NANOSENSORS SuperSharpSilicon™ AFM probes for high resolution atomic force microscopy imaging can be found in the usual literature repositories.

References to NANOSENSORS SuperSharpSilicon AFM probes in scientific literature:

SSS-NCHR SuperSharpSilicon™ – Non-Contact / Tapping mode – High Resonance Frequency – Reflex Coating

So Nagashima, Sun Mi Yoon, Do Hyun Kim, Akihiro Nakatani, Myoung-Woon Moon
Wrinkle-Assisted Capillary Bridging for the Directed Assembly of Single-Level DNA Nanowire Arrays
Advanced Materials Interfaces, Volume 9, Issue 6, February 22, 2022, 2102243
DOI: https://doi.org/10.1002/admi.202102243

Mario Raspanti, Marina Protasoni, Piero Antonio Zecca, Marcella Reguzzoni
Slippery when wet: The free surface of the articular cartilage
Microscopy Research & Technique, Volume 84, Issue 6, June 2021, Pages 1257-1264
DOI: https://doi.org/10.1002/jemt.23684

Oliver Braun, Jan Overbeck, Maria El Abbassi, Silvan Käser, Roman Furrer, Antonis Olziersky, Alexander Flasby,  Gabriela Borin Barin, Qiang Sun, Rimah Darawish, Klaus Müllen, Pascal Ruffieux, Roman Fasel, Ivan Shorubalko, Mickael L. Perrin, Michel Calame
Optimized graphene electrodes for contacting graphene nanoribbons
Carbon, Volume 184, 30 October 2021, Pages 331-339
DOI: https://doi.org/10.1016/j.carbon.2021.08.001

Selina Goetz, Daniella Mehanni, Neha Bansal, Bernhard Kubicek, Rachmat Adhi Wibowo, Martin Bauch, Christian Linke, Enrico Franzke, Jörg Winkler, Toby Meyer, Stephanie Narbey, David Stock, Markus Valtiner, and Theodoros Dimopoulos
Low-Temperature-Processed Transparent Electrodes Based on Compact and Mesoporous Titanium Oxide Layers for Flexible Perovskite Solar Cells
ACS Applied Energy Materials 2021
DOI: https://doi.org/10.1021/acsaem.1c01129

Abeer Fahes, Aotmane En Naciri, Mohammad Navvabpour, Safi Jradi and Suzanna Akil
Self-Assembled Ag Nanocomposites into Ultra-Sensitive and Reproducible Large-Area SERS-Active Opaque Substrates
Nanomaterials 2021, 11(8), 2055
DOI: https://doi.org/10.3390/nano11082055

 

SSS-NCLRSuperSharpSilicon™ – Non-Contact / Tapping Mode – Long Cantilever – Reflex Coating

Gaoliang Dai, Xiukun Hu, Julian Hering, Matthias Eifler, Jörg Seewig and Georg von Freymann
Define and measure the dimensional accuracy of two-photon laser lithography based on its instrument transfer function
Journal of Physics: Photonics, 2021, Volume 3, Number 3 034002
DOI: https://doi.org/10.1088/2515-7647/abfaa7

Martyn Sozanskyi, Vitalii Stadnik, Pavlo Shapoval, Iosyp Yatchyshyn, Ruslana Guminilovych, Stepan Shapoval
Optimization of Synthesis Conditions of Mercury Selenide Thin Films
Chemistry & Chemical Technology, 2020, Vo. 14, No 3, pp. 290 – 296
DOI: https://doi.org/10.23939/chcht14.03.290

J Jakubowcz, G Adamek, M Sopata, J K Kope and P Siwak
Hot pressing of nanocrystalline tantalum using high frequency induction heating and pulse plasma sintering
IOP Conference Series: Materials Science and Engineering, Volume 283, 6th Global Conference on Materials Science and Engineering 24–27 October 2017, Beijing, China, 283 012001
DOI: https://doi.org/10.1088/1757-899X/283/1/012001

Taskin Tuna, Martin Wein, Michael Swain, Jens Fischer, Wael Att
Influence of ultraviolet photofunctionalization on the surface characteristics of zirconia-based dental implant materials
Dental Materials, Volume 31, Issue 2, February 2015, Pages e14-e24
DOI: https://doi.org/10.1016/j.dental.2014.10.008

D. Bergmann, B. Bodermann, H. Bosse, E. Buhr, G. Dai, R. Dixson, W. Häßler-Grohne, K. Hahm, and M. Wurm
Photomask linewidth comparison by PTB and NIST
Proceedings Volume 9636, Scanning Microscopies 2015; 96360S (2015) (2 November 2015); Event: SPIE Scanning Microscopies, 2015, Monterey, California, United States
DOI: https://doi.org/10.1117/12.2199453

 

SSS-SEIHRSuperSharpSilicon™ – SEIKO Microscopes – Non-Contact / Tapping Mode – High Force Constant – Reflex Coating

Jiang Yang, Tai Wang, Lina Zhao, Vinagolu K. Rajasekhar, Suhasini Joshi, Chrysafis Andreou, Suchetan Pal, Hsiao-ting Hsu, Hanwen Zhang, Ivan J. Cohen, Ruimin Huang, Ronald C. Hendrickson, Matthew M. Miele, Wenbo Pei, Matthew B. Brendel, John H. Healey, Gabriela Chiosis, and Moritz F. Kircher
Gold/alpha-lactalbumin nanoprobes for the imaging and treatment of breast cancer
Nature Biomedical Engineering 4, pages 686–703 (2020)
DOI: https://doi.org/10.1038/s41551-020-0584-z

Anna D. Protopopova, Andrea Ramirez, Dmitry V. Klinov, Rustem I. Litvinov, John W. Weisel
Factor XIII topology: organization of B subunits and changes with activation studied with single-molecule atomic force microscopy
Journal of Thrombosis and Haemostasis, Volume 17, Issue 5, May 2019, Pages 737-748
DOI: https://doi.org/10.1111/jth.14412

Santu Bera, Sudipta Mondal, Bin Xue, Linda J. W. Shimon, Yi Cao and Ehud Gazit
Rigid helical-like assemblies from a self-aggregating tripeptide
Nature Materials volume 18, pages 503–509 (2019)
DOI: https://doi.org/10.1038/s41563-019-0343-2

Chao Liang, Zonghuang Ye, Bin Xue, Ling Zeng, Wenjian Wu, Chao Zhong, Yi Cao*, Biru Hu*, and Phillip B Messersmith
Self-Assembled Nanofibers for Strong Underwater Adhesion: The Trick of Barnacles
ACS Applied Materials and Interfaces 2018, 10, 30, 25017–25025
DOI: https://doi.org/10.1021/acsami.8b04752

Anna D. Protopopova, Rustem I. Litvinov, Dennis K. Galanakis, Chandrasekaran Nagaswami, Nikolay A. Barinov, Alexander R. Mukhitov, Dmitry V. Klinov and John W. Weisela
Morphometric characterization of fibrinogen’s αC regions and their role in fibrin self-assembly and molecular organization
Nanoscale. 2017 Sep 21; 9(36): 13707–13716.
DOI: 10.1039/c7nr04413e

 

SSS-FMR SuperSharpSilicon™- Force Modulation Mode – Reflex Coating

Dmitry V. Bagrov, Grigory S. Glukhov, Andrey V. Moiseenko, Maria G. Karlova, Daniil S. Litvinov, Petr А. Zaitsev, Liubov I. Kozlovskaya, Anna A. Shishova, Anastasia A. Kovpak, Yury Y. Ivin, Anastasia N. Piniaeva, Alexey S. Oksanich, Viktor P. Volok, Dmitry I. Osolodkin, Aydar A. Ishmukhametov, Alexey M. Egorov, Konstantin V. Shaitan, Mikhail P. Kirpichnikov, Olga S. Sokolova
Structural characterization of β-propiolactone inactivated severe acute respiratory syndrome coronavirus 2 (SARS-CoV-2) particles
Microscopy Research & Technique, Volume 85, Issue 2, February 2022, Pages 562-569
DOI: https://doi.org/10.1002/jemt.23931

P. Bampoulis
Temperature induced dynamics of water confined between graphene and MoS2
The Journal of Chemical Physics 154, 134705 (2021)
DOI: https://doi.org/10.1063/5.0044123

Josué J. López, Antonio Ambrosio, Siyuan Dai, Chuong Huynh, David C. Bell, Xiao Lin, Nicholas Rivera, Shengxi Huang, Qiong Ma, Soeren Eyhusen, Ido E. Kaminer, Kenji Watanabe, Takashi Taniguchi, Jing Kong, Dimitri N. Basov, Pablo Jarillo-Herrero, Marin Soljačić
Large Photothermal Effect in Sub-40 nm h-BN Nanostructures Patterned Via High-Resolution Ion Beam
Nano Micro Small, Volume 14, Issue 22, May 29, 2018, 1800072
DOI: https://doi.org/10.1002/smll.201800072

Bernhard M.Berger, Reinhard Stadlmayr, Dominic Blöch, Elisabeth Gruber, Kazuyoshi Sugiyama, Thomas Schwarz-Selinger, Friedrich Aumayr
Erosion of Fe-W model system under normal and oblige D ion irradiation
Nuclear Materials and Energy, Volume 12, August 2017, Pages 468-471
DOI: https://doi.org/10.1016/j.nme.2017.03.030

Wojciech Kwieciñski, Kai Sotthewes, Bene Poelsema, Harold J.W.Zandvliet, Pantelis Bampoulis
Chemical vapor deposition growth of bilayer graphene in between molybdenum disulfide sheets
Journal of Colloid and Interface Science, Volume 505, 1 November 2017, Pages 776-782
DOI: https://doi.org/10.1016/j.jcis.2017.06.076

 

SSS-MFMRSuperSharpSilicon™ Magnetic Force Microscopy – Reflex Coating

Sai Lia, Ao Du, Yadong Wang, Xinran Wang, Xueying Zhang, Houyi Cheng, Wenlong Cai, Shiyang Lu, Kaihua Cao, Biao Pan, Na Lei, Wang Kang, Junming Liu, Albert Fert, Zhipeng Hou, Weisheng Zhao
Experimental demonstration of skyrmionic magnetic tunnel junction at room temperature
Science Bulletin, Available online 15 January 2022
DOI: https://doi.org/10.1016/j.scib.2022.01.016

Martin Stückler, Christian Teichert, Aleksandar Matković, Heinz Krenn, Lukas Weissitsch, Stefan Wurster, Reinhard Pippan, AndreaBachmaier
On the magnetic nanostructure of a Co–Cu alloy processed by high-pressure torsion
Journal of Science: Advanced Materials and Devices, Volume 6, Issue 1, March 2021, Pages 33-41
DOI: https://doi.org/10.1016/j.jsamd.2020.09.013

Victor G. Gisbert, Carlos A. Amo, Miriam Jaafar, Agustina Asenjo and Ricardo Garcia
Quantitative mapping of magnetic properties at the nanoscale with bimodal AFM
Nanoscale, 2021, 13, 2026-2033
DOI: 10.1039/D0NR08662B

You Ba, Shihao Zhuang, Yike Zhang, Yutong Wang, Yang Gao, Hengan Zhou, Mingfeng Chen, Weideng Sun, Quan Liu, Guozhi Chai, Jing Ma, Ying Zhang, Huanfang Tian, Haifeng Du, Wanjun Jiang, Cewen Nan, Jia-Mian Hu and Yonggang Zhao
Electric-field control of skyrmions in multiferroic heterostructure via magnetoelectric coupling
Nature Communications volume 12, Article number: 322 (2021)
DOI: https://doi.org/10.1038/s41467-020-20528-y

Federico Cesano, Sara Cravanzola, Valentina Brunella, Alessandro Damin and Domenica Scarano
From Polymer to Magnetic Porous Carbon Spheres: Combined Microscopy, Spectroscopy, and Porosity Studies
Frontiers in Materials (2019) 6:84
DOI: https://doi.org/10.3389/fmats.2019.00084

 

SSS-QMFMRSuperSharpSilicon™ – High Quality-Factor – Magnetic Force Microscopy – Reflex Coating

Peter Milde, Erik Neuber, Andreas Bauer, Christian Pfleiderer and Lukas M. Eng
Surface pinning and triggered unwinding of skyrmions in a cubic chiral magnet
Physical Review B 100, 024408
DOI: https://doi.org/10.1103/PhysRevB.100.024408

Erik Neuber, Peter Milde, Adam Butykai, Sandor Bordacs, Hiroyuki Nakamura, Takeshi Waki, Yoshikazu Tabata, Korbinian Geirhos, Peter Lunkenheimer, Istvan Kézsmárki, Petr Ondrejkovic, Jirka Hlinka and Lukas M Eng
Architecture of nanoscale ferroelectric domains in GaMo4S8
Journal of Physics: Condensed Matter, Volume 30, Number 44, 445402
DOI: https://doi.org/10.1088/1361-648X/aae448

N. León-Brito, E. D. Bauer, F. Ronning, J. D. Thompson, and R. Movshovicha
Magnetic microstructure and magnetic properties of uniaxial itinerant ferromagnet Fe3GeTe2
Journal of Applied Physics 120, 083903 (2016)
DOI: https://doi.org/10.1063/1.4961592

I. Kézsmárki, S. Bordács, P. Milde, E. Neuber, L. M. Eng, J. S. White, H. M. Rønnow, C. D. Dewhurst, M. Mochizuki, K. Yanai, H. Nakamura, D. Ehlers, V. Tsurkan and A. Loidl
Néel-type skyrmion lattice with confined orientation in the polar magnetic semiconductor GaV4S8
Nature Materials volume 14, pages 1116–1122 (2015)
DOI: https://doi.org/10.1038/nmat4402

Jeehoon Kim, N. Haberkorn, Suenne Kim, L. Civale, P. C. Dowden and R. Movshovich
Ferromagnetic bubble clusters in Y0.67Ca0.33MnO3 thin films
Applied Physics Letter 102, 192409 (2013)
DOI: https://doi.org/10.1063/1.4806967

Due to their very small AFM tip radius all AFM probes of the SuperSharpSilicon™ AFM probe series need careful expert handling. The higher the aspect ratio and the smaller the tip radius of an AFM tip is the more it will be susceptible to electrostatic discharge (ESD) which can destroy the AFM tip. It is therefore important to always make sure to take all necessary precautions against electrostatic discharge (ESD) whenever you are handling these special AFM probes so that their high quality leads to the expected high resolution AFM images and the AFM tip doesn’t become damaged before it has been used. This can be achieved in the usual way by e.g. using an ESD-safe handling kit consisting of a dissipative mat, grounding wire, wrist band and helix cable with integrated safety resistors and ESD safe tweezers.

The SuperSharpSilicon™ AFM probes screencast is also available in a Chinese version  “视频介绍 – SuperSharpSilicon原子力显微镜探针”on

Youtube https://youtu.be/0sVpACGdxQM and on Youku https://v.youku.com/v_show/id_XOTIzNjg0NDQ0.html

A Japanese version of the SuperSharpSilicon AFM probe video: 超·高分解能観察用 スーパーシャープ シリコンプローブ SuperSharpSilicon” is also available on Youtube: https://youtu.be/HKK2QorNLqY