Friction in nanoscale contacts is determined by the size and structure of the interface that is hidden between the contacting bodies. One approach to investigating… Read More »Insights into dynamic sliding contacts from conductive atomic force microscopy
“Fast growth in Internet of Things (IoT) has attracted a lot of attention of flexible and easily processable hybrid organic-inorganic nanomaterials, integrated into modern electronics… Read More »Conductive Polymer-Ag Honeycomb Thin Film: The Factors Affecting the Complexity of the Microstructure
NANOSENSORS PPP-EFM AFM tips were used in the research for this article. Have a look at the abstract or follow the external link to the… Read More »Injection and controlled motion of conducting domain walls in improper ferroelectric Cu-Cl boracite
NANOSENSORS PtIr coated PPP-EFM AFM tips were used for the PFM imaging in this interesting paper. Yogesh Sharma, Radhe Agarwal, Charudatta Phatak, Bumsoo Kim, Seokwoo… Read More »Long-range Stripe Nanodomains in Epitaxial (110) BiFeO 3 Thin Films on (100) NdGaO 3 Substrate
In this article the authors demonstrate that intermittent-contact atomic force microscopy (AFM) can detect the Hall effect in conducting domain walls. NANOSENSORS PPP-EFM AFM tips… Read More »Hall effect in charged conducting ferroelectric domain walls
A NANOSENSORS PPP-EFM AFM tip was used in the research for this paper. Nature Comm: GMode makes piezoresponse force microscopy 1000 times faster. Suhas Somnath,,… Read More »Rapid mapping of polarization switching through complete information acquisition
The screencast on the wear-resistant conductive platinum silicide AFM probes -( PtSi) held by Dr. Oliver Krause on Youtube https://youtu.be/w0Tjg08ai-I has just passed the 500… Read More »Wear-resistant Conductive Platinum Silicide AFM Probes (PtSi) Video has 500 views