Special Developments List
- On request we offer Special Developments and customized solutions
- Availability and price on request
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Contact |
qp-CONT |
YES |
Contact Mode, Biological Applications / Soft Contact Measurement, Fluid Tapping / AC Mode |
0.1 | 30 |
qp-SCONT |
YES |
Soft Contact Mode, Biological Applications / Soft Contact Measurement, Lateral / Friction Force Microscopy, Fluid Tapping / AC Mode |
0.01 | 11 | |
Non-contact |
qp-BioT 2 cantilevers |
YES |
Biological Applications / Soft Contact Measurement, Fluid Tapping / AC Mode |
CB1: 0.3 CB2: 0.08 |
CB1: 50 CB2: 20 |
qp-BioAC 3 cantilevers |
YES |
Biological Applications / Soft Contact Measurement, Fluid Tapping / AC Mode |
CB1: 0.3 CB2: 0.1 CB3: 0.06 |
CB1: 90 CB2: 50 CB3: 30 |
|
qp-BioAC-CI 3 cantilevers |
YES |
Special tip shape for live cell imaging Biological Applications / Soft Contact Measurement, Fluid Tapping / AC Mode |
CB1: 0.3 CB2: 0.1 CB3: 0.06 |
CB1: 90 CB2: 50 CB3: 30 |
|
Special |
qp-fast 3 cantilevers |
YES |
Fast / High Speed Scanning, Standard Tapping / NC / AC Mode, Soft Tapping / NC / AC Mode |
CB1: 80 CB2: 30 CB3: 15 |
CB1: 800 CB2: 420 CB3: 250 |
qp-HBC |
YES | Scan Asyst®* Peak Force Tapping® | 0.5 | 60 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Contact |
PtSi-CONT |
YES |
Electrostatic Force Microscopy / Electrical Measurement, Long Lifetime / Hardened AC AFM Probes |
0.2 | 13 |
Non-contact |
PtSi-NCH |
YES |
Electrostatic Force Microscopy / Electrical Measurement, Long Lifetime / Hardened AC AFM Probes |
42 | 330 |
Special |
PtSi-FM |
YES |
Electrostatic Force Microscopy / Electrical Measurement, Long Lifetime / Hardened AC AFM Probes |
2.8 | 75 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Contact |
ATEC-CONT |
NO | Contact Mode | 0.2 | 15 |
ATEC-CONTAu |
YES |
Biological Applications / Soft Contact Measurement, Electrostatic Force Microscopy / Electrical Measurement |
0.2 | 15 | |
ATEC-CONTPt |
YES | Electrostatic Force Microscopy / Electrical Measurement | 0.2 | 15 | |
Non-contact |
ATEC-NC |
NO | Tapping / NC / AC Mode | 45 | 335 |
ATEC-NCAu |
YES |
Biological Applications, Electrostatic Force Microscopy / Electrical Measurement |
45 | 335 | |
ATEC-NCPt |
YES | Electrostatic Force Microscopy / Electrical Measurement | 45 | 335 | |
Special |
ATEC-FM |
NO | Force Modulation Mode | 2.8 | 85 |
ATEC-FMAu |
YES |
Electrostatic Force Microscopy / Electrical Measurement, Biological Applications |
2.8 | 85 | |
ATEC-EFM |
YES | Electrostatic Force Microscopy / Electrical Measurement | 2.8 | 85 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Contact |
PPP-CONT |
NO | Contact mode | 0.2 | 13 |
PPP-CONTR |
YES | Contact mode | 0.2 | 13 | |
PPP-CONTSC |
NO |
Contact mode (short AFM cantilever) |
0.2 | 25 | |
PPP-CONTSCR |
YES |
Contact mode (short AFM cantilever) |
0.2 | 25 | |
PPP-XYCONTR |
YES |
Contact mode, XY-Alignment Compatible |
0.2 | 13 | |
PPP-ZEILR |
YES |
Contact mode (Seiko or Zeiss Veritect) |
1.6 | 27 | |
Non-contact |
PPP-NCR |
YES |
NC/AC/Tapping Mode, Vacuum AFM Probes, AC160 Mechanical Properties |
26 | 300 |
PPP-NCH |
NO |
NC/AC/Tapping Mode, Vacuum AFM Probes |
42 | 330 | |
PPP-NCHR |
YES |
NC/AC/Tapping Mode, Vacuum AFM Probes |
42 | 330 | |
PPP-NCL |
NO |
NC/AC/Tapping Mode, Vacuum AFM Probes (long AFM cantilever) |
48 | 190 | |
PPP-NCLR |
YES |
NC/AC/Tapping Mode, Vacuum AFM Probes (long AFM cantilever) |
48 | 190 | |
PPP-NCST |
NO | Soft Tapping / NC / AC Mode | 7.4 | 160 | |
PPP-NCSTR |
YES | Soft Tapping / NC / AC Mode | 7.4 | 160 | |
PPP-QNCHR |
YES |
NC/AC/Tapping Mode, Vacuum AFM Probes (high frequency, high quality factor) |
42 | 330 | |
PPP-SEIHR |
YES |
Soft Tapping / NC / AC Mode (Seiko or Zeiss Veritect) |
15 | 130 | |
PPP-XYNCHR |
YES |
NC/AC/Tapping Mode, Vacuum AFM Probes, XY-Alignment Compatible |
42 | 330 | |
PPP-XYNCSTR |
YES |
Soft Tapping / NC / AC Mode, XY-Alignment Compatible |
7.4 | 160 | |
Special |
PPP-FM |
NO |
Force Modulation Mode, Soft Tapping / NC / AC Mode, Vacuum AFM Probes |
2.8 | 75 |
PPP-FMR |
YES |
Force Modulation Mode, Soft Tapping / NC / AC Mode, Vacuum AFM Probes |
2.8 | 75 | |
PPP-LFMR |
YES |
Contact Mode , Lateral / Friction Force Microscopy (LFM) |
0.2 | 23 | |
PPP-QFMR |
YES |
Force Modulation Mode, Vacuum AFM Probes (high quality factor) |
2.8 | 75 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Contact |
PPP-CONTSC |
NO |
Contact mode (short AFM cantilever) |
0.2 | 25 |
PPP-CONTSCR |
YES |
Contact mode (short AFM cantilever) |
0.2 | 25 | |
PPP-CONTSCAuD |
YES |
Contact mode, Biological Applications / Soft Contact Measurement (short AFM cantilever) |
0.2 | 25 | |
PPP-XYCONTR |
YES |
Contact mode, XY-Alignment Compatible |
0.2 | 13 | |
Non-contact |
PPP-NCL |
NO |
NC/AC/Tapping Mode, Vacuum AFM Probes (long AFM cantilever) |
48 | 190 |
PPP-NCLR |
YES |
NC/AC/Tapping Mode, Vacuum AFM Probes (long AFM cantilever) |
48 | 190 | |
PPP-NCLAuD |
YES |
NC/AC/Tapping Mode, Biological Applications / Soft Contact Measurement (long AFM cantilever) |
48 | 190 | |
PPP-SEIHR |
YES |
Soft Tapping / NC / AC Mode (Seiko or Zeiss Veritect) |
15 | 130 | |
PPP-XYNCHR |
YES |
NC/AC/Tapping Mode, Vacuum AFM Probes, XY-Alignment Compatible |
42 | 330 | |
PPP-XYNCSTR |
YES |
Soft Tapping / NC / AC Mode, XY-Alignment Compatible |
7.4 | 160 | |
Special |
PPP-FM |
NO |
Force Modulation Mode, Soft Tapping / NC / AC Mode, Vacuum AFM Probes |
2.8 | 75 |
PPP-FMR |
YES |
Force Modulation Mode, Soft Tapping / NC / AC Mode, Vacuum AFM Probes |
2.8 | 75 | |
PPP-FMAuD |
YES |
Force Modulation Mode, Biological Applications |
2.8 | 75 | |
PPP-LFMR |
YES |
Contact Mode , Lateral / Friction Force Microscopy (LFM) |
0.2 | 23 | |
PPP-QFMR |
YES |
Force Modulation Mode, Vacuum AFM Probes (high quality factor) |
2.8 | 75 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Non-contact |
SSS-NCL |
NO |
Enhanced Resolution Tapping / NC / AC AFM probes (long cantilever) |
48 | 190 |
SSS-NCLR |
YES |
Enhanced Resolution Tapping / NC / AC AFM probes (long cantilever) |
48 | 190 | |
SSS-SEIH |
NO |
Enhanced Resolution Tapping / NC / AC AFM probes (Seiko or Zeiss Veritect) |
15 | 130 | |
SSS-SEIHR |
YES |
Enhanced Resolution Tapping / NC / AC AFM probes (Seiko or Zeiss Veritect) |
15 | 130 | |
Special |
SSS-FM |
NO | Enhanced Resolution Tapping / NC / AC AFM probes | 2.8 | 75 |
SSS-FMR |
YES | Enhanced Resolution Tapping / NC / AC AFM probes | 2.8 | 75 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Non-contact |
AR5-NCLR |
YES |
Trench Measurement (long AFM cantilever) |
48 | 190 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Contact |
PPP-CONTSCAu |
YES |
Biological Applications / Soft Contact Measurement, Electrostatic Force Microscopy / Electrical Measurement (short AFM cantilever) |
0.2 | 25 |
PPP-CONTSCPt |
YES |
Electrostatic Force Microscopy / Electrical Measurement (short AFM cantilever) |
0.2 | 25 | |
Non-contact |
CDT-NCLR |
YES |
Electrostatic Force Microscopy / Electrical Measurement (long AFM cantilever) |
72 | 210 |
DT-NCLR |
YES |
Long Lifetime / Hardened AC AFM Probes, Nanoindentation (long AFM cantilever) |
72 | 210 | |
PPP-NCLAu |
YES |
Biological Applications, Electrostatic Force Microscopy / Electrical Measurement (long AFM cantilever) |
48 | 190 | |
PPP-NCLPt |
YES |
Electrostatic Force Microscopy / Electrical Measurement (long AFM cantilever) |
48 | 190 | |
Special |
CDT-FMR |
YES | Electrostatic Force Microscopy / Electrical Measurement | 6.2 | 105 |
DT-FMR |
YES |
Long Lifetime / Hardened AC AFM Probes, Nanoindentation |
6.2 | 105 | |
PPP-FMAu |
YES |
Biological Applications, Electrostatic Force Microscopy / Electrical Measurement |
2.8 | 75 | |
PPP-EFM |
YES | Electrostatic Force Microscopy / Electrical Measurement | 2.8 | 75 | |
PPP-MFMR |
YES | Magnetic Force Microscopy | 2.8 | 75 | |
PPP-LC-MFMR |
YES |
Magnetic Force Microscopy (low coercivity) |
2.8 | 75 | |
PPP-LM-MFMR |
YES |
Magnetic Force Microscopy (low moment) |
2.8 | 75 | |
PPP-QLC-MFMR |
YES |
Magnetic Force Microscopy (low coercivity, high quality factor) |
2.8 | 75 | |
SSS-MFMR |
YES |
Magnetic Force Microscopy (high resolution) |
2.8 | 75 | |
SSS-QMFMR |
YES |
Magnetic Force Microscopy (high resolution, high quality factor) |
2.8 | 75 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Non-contact |
SSS-NCH |
NO |
Enhanced Resolution Tapping / NC / AC Mode (high frequency) |
42 | 330 |
SSS-NCHR |
YES |
Enhanced Resolution Tapping / NC / AC Mode (high frequency) |
42 | 330 | |
SSS-NCL |
NO |
Enhanced Resolution Tapping / NC / AC Mode (long AFM cantilever) |
48 | 190 | |
SSS-NCLR |
YES |
Enhanced Resolution Tapping / NC / AC Mode (long AFM cantilever) |
48 | 190 | |
SSS-SEIH |
NO |
Enhanced Resolution Tapping / NC / AC Mode (Seiko or Zeiss Veritect) |
15 | 130 | |
SSS-SEIHR |
YES |
Enhanced Resolution Tapping / NC / AC Mode (Seiko or Zeiss Veritect) |
15 | 130 | |
Special |
SSS-FM |
NO | Enhanced Resolution Tapping / NC / AC Mode | 2.8 | 75 |
SSS-FMR |
YES | Enhanced Resolution Tapping / NC / AC Mode | 2.8 | 75 | |
SSS-MFMR |
YES |
Magnetic Force Microscopy (high resolution) |
2.8 | 75 | |
SSS-QMFMR |
YES |
Magnetic Force Microscopy (high resolution, high quality factor) |
2.8 | 75 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Non-contact |
AR10-NCHR |
YES |
Trench Measurement (high frequency) |
42 | 330 |
AR10T-NCHR |
YES |
Trench Measurement (tilt compensated, high frequency) |
42 | 330 | |
AR5-NCH |
NO |
Trench Measurement (high frequency) |
42 | 330 | |
AR5-NCHR |
YES |
Trench Measurement (high frequency) |
42 | 330 | |
AR5-NCLR |
YES |
Trench Measurement (long cantilever) |
48 | 190 | |
AR5T-NCHR |
YES |
Trench Measurement (tilt compensated, high frequency) |
42 | 330 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Contact |
PPP-RT-CONTR |
YES | Contact Mode | 0.2 | 13 |
Non-contact |
PPP-RT-NCHR |
YES |
Tapping / NC / AC Mode (high frequency) |
42 | 330 |
Special |
PPP-RT-FMR |
YES | Force Modulation Mode | 2.8 | 75 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Contact |
TL-CONT |
NO | Tipless Cantilever for Probe Modification | 0.2 | 13 |
Non-contact |
TL-NCH |
NO |
Tipless Cantilever for Probe Modification (high frequency) |
42 | 330 |
TL-NCL |
NO |
Tipless Cantilever for Probe Modification (long AFM cantilever) |
48 | 190 | |
Special |
TL-FM |
NO | Tipless Cantilever for Probe Modification | 2.8 | 75 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
---|
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Contact |
ATEC-CONTAu |
YES |
Biological Applications / Soft Contact Measurement, Electrostatic Force Microscopy / Electrical Measurement |
0.2 | 15 |
Non-contact |
ATEC-NCAu |
YES |
Biological Applications, Electrostatic Force Microscopy / Electrical Measurement |
45 | 335 |
Special |
ATEC-FMAu |
YES |
Electrostatic Force Microscopy / Electrical Measurement, Biological Applications |
2.8 | 85 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Contact |
PPP-CONTAu |
YES |
Contact Mode, Biological Applications / Soft Contact Measurement, Electrostatic Force Microscopy / Electrical Measurement |
0.2 | 13 |
PPP-CONTAuD |
YES |
Contact Mode, Biological Applications / Soft Contact Measurement |
0.2 | 13 | |
PPP-CONTSCAu |
YES |
Contact Mode, Biological Applications / Soft Contact Measurement, Electrostatic Force Microscopy / Electrical Measurement (short AFM cantilever) |
0.2 | 25 | |
PPP-CONTSCAuD |
YES |
Contact Mode, Biological Applications / Soft Contact Measurement (short AFM cantilever) |
0.2 | 25 | |
Non-contact |
PPP-NCHAu |
YES |
Biological Applications, Electrostatic Force Microscopy / Electrical Measurement (high frequency) |
42 | 330 |
PPP-NCHAuD |
YES |
Tapping / NC / AC Mode, Biological Applications (high frequency) |
42 | 330 | |
PPP-NCLAu |
YES |
Biological Applications, Electrostatic Force Microscopy / Electrical Measurement (long AFM cantilever)) |
48 | 190 | |
PPP-NCLAuD |
YES |
Tapping / NC / AC Mode, Biological Applications (long AFM cantilever) |
48 | 190 | |
PPP-NCSTAu |
YES |
Biological Applications, Electrostatic Force Microscopy / Electrical Measurement |
7.4 | 160 | |
PPP-NCSTAuD |
YES |
Soft Tapping / NC / AC Mode, Biological Applications |
7.4 | 160 | |
Special |
PPP-FMAu |
YES |
Biological Applications, Electrostatic Force Microscopy / Electrical Measurement |
2.8 | 75 |
PPP-FMAuD |
YES |
Force Modulation Mode, Biological Applications |
2.8 | 75 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Contact |
CDT-CONTR |
YES | Electrostatic Force Microscopy / Electrical Measurement | 0.5 | 20 |
DT-CONTR |
YES |
Long Lifetime / Hardened AC AFM Probes, Nanoindentation |
0.5 | 20 | |
Non-contact |
CDT-NCHR |
YES |
Electrostatic Force Microscopy / Electrical Measurement (high frequency) |
80 | 400 |
DT-NCHR |
YES |
Long Lifetime / Hardened AC AFM Probes, Nanoindentation (high frequency) |
80 | 400 | |
CDT-NCLR |
YES |
Electrostatic Force Microscopy / Electrical Measurement (long AFM cantilever) |
72 | 210 | |
DT-NCLR |
YES |
Long Lifetime / Hardened AC AFM Probes, Nanoindentation (long AFM cantilever) |
72 | 210 | |
Special |
CDT-FMR |
YES | Electrostatic Force Microscopy / Electrical Measurement | 6.2 | 105 |
DT-FMR |
YES |
Long Lifetime / Hardened AC AFM Probes, Nanoindentation |
6.2 | 105 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Contact |
ATEC-CONTPt |
YES | Electrostatic Force Microscopy / Electrical Measurement | 0.2 | 15 |
Non-contact |
ATEC-NCPt |
YES | Electrostatic Force Microscopy / Electrical Measurement | 45 | 335 |
Special |
ATEC-EFM |
YES | Electrostatic Force Microscopy / Electrical Measurement | 2.8 | 85 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Contact |
PPP-CONTPt |
YES | Electrostatic Force Microscopy / Electrical Measurement | 0.2 | 13 |
PPP-CONTSCPt |
YES |
Electrostatic Force Microscopy / Electrical Measurement (short cantilever) |
0.2 | 25 | |
Non-contact |
PPP-NCHPt |
YES |
Electrostatic Force Microscopy / Electrical Measurement (high frequency) |
42 | 330 |
PPP-NCLPt |
YES |
Electrostatic Force Microscopy / Electrical Measurement (long cantilever) |
48 | 190 | |
PPP-NCSTPt |
YES | Electrostatic Force Microscopy / Electrical Measurement | 7.4 | 160 | |
Special |
PPP-EFM |
YES | Electrostatic Force Microscopy / Electrical Measurement | 2.8 | 75 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Special |
PPP-MFMR |
YES | Magnetic Force Microscopy | 2.8 | 75 |
PPP-LC-MFMR |
YES |
Magnetic Force Microscopy (low coercivity) |
2.8 | 75 | |
PPP-LM-MFMR |
YES |
Magnetic Force Microscopy (low moment) |
2.8 | 75 | |
PPP-QLC-MFMR |
YES |
Magnetic Force Microscopy (low coercivity, high quality factor) |
2.8 | 75 | |
SSS-MFMR |
YES |
Magnetic Force Microscopy (high resolution) |
2.8 | 75 | |
SSS-QMFMR |
YES |
Magnetic Force Microscopy (high resolution, high quality factor) |
2.8 | 75 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Special |
Akiyama-Probe |
NO | Self-sensing + self-actuating | 5 | 45 |
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
|
---|---|---|---|---|---|
Contact |
Special Developments List (SDL) |
NO |
In close cooperation with national technical authorities for metrology in Europe, NANOSENSORS™ has developed a set of calibration standards for SPM applications. These standards allow the calibration of the X,Y and Z axis of an SPM machine. In addition certain system induced limitations of such apparatus can be revealed and compensated.
2D Pitch Standard TYPE: 2D200
The German PTB (Physikalisch Technische Bundesanstalt), Great Britain NPL (National Physical Laboratory) and the Danish Institute of Fundamental Metrology (DFM) participated not only in the product definition phase. Their main task was the development of measurement technology for calibrating the standards. These institutions ensure the traceability not only to national standards. Through european (EUROMET) and international cooperations (Metre Convention) traceability to other worldwide metrology standards is achieved.
Type | Reflective coating | Application | Force constant [N/m] |
Resonance frequency [kHz] |
---|