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Tipless - Force Modulation Mode

NANOSENSORS™ TL-FM probes are designed for special applications where no tip at the cantilever is needed.

The probe offers unique features:

• no tip
• highly doped silicon to dissipate static charge
• chemically inert
• high mechanical Q-factor for high sensitivity
• alignment grooves on backside of silicon holder chip
• precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
• compatible with PointProbe® Plus XY-Alignment Series

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

How to optimize AFM scanning parameters:

Cantilever data:

Property	Nominal Value	Specified Range
Resonance Frequency [kHz]	75	45 - 115
Force Constant [N/m]	2.8	0.5 - 9.5
Length [µm]	225	215 - 235
Mean Width [µm]	28	20 - 35
Thickness [µm]	3	2 - 4

Order codes and shipping units:

Order Code	AFM probes per pack	Data sheet
TL-FM-10	10	of all probes
TL-FM-20	20	of all probes
TL-FM-50	50