Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 300 200 - 400
Force Constant [N/m] 26 10 - 58
Length [µm] 125 115 - 135
Mean Width [µm] 29 21.5 - 36.5
Thickness [µm] 3.5 2.5 - 4.5
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-NCR-10 10 of all probes
PPP-NCR-20 20 of all probes
PPP-NCR-50 50
PPP-NCR-W 380 of up to 32 probes

PointProbe® Plus Non-Contact / Tapping Mode - Reflex Coating

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCR AFM probes are especially designed with the same mechanical properties as the Olympus** AC160 AFM probe for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode).This AFM probe combines high operation stability with outstanding sensitivity.

This AFM probe offers unique features:

  • same typical frequency and force constant range as Olympus** AC160
  • excellent tip radius of curvature
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of AFM cantilever
  • high mechanical Q-factor for high sensitivity

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.