PPP-CONTSC

PointProbe® Plus Contact Mode Short Cantilever

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

The NANOSENSORS™ PPP-CONTSC is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

The probe offers unique features:

  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series
Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency / kHz 25 1 - 57
Force Constant /(N/m) 0.2 0.01 - 1.87
Length /µm 225 215 - 235
Mean Width /µm 48 40 - 55
Thickness /µm 1 0.1 - 2
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-CONTSC-10 10 of all probes
PPP-CONTSC-20 20 of all probes
PPP-CONTSC-50 50
PPP-CONTSC-W 380 of up to 32 probes
NANOSENSORS™ PointProbe® Plus AFM Probes