PPP-CONTSC

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 25 1 - 57
Force Constant [N/m] 0.2 0.01 - 1.87
Length [µm] 225 215 - 235
Mean Width [µm] 48 40 - 55
Thickness [µm] 1 0.1 - 2
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-CONTSC-10 10 of all probes
PPP-CONTSC-20 20 of all probes
PPP-CONTSC-50 50
PPP-CONTSC-W 380 of up to 32 probes
NANOSENSORS™ PointProbe® Plus AFM Probes

PointProbe® Plus Contact Mode Short Cantilever

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible AFM tip radius as well as a more defined AFM tip shape. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.

The NANOSENSORS™ PPP-CONTSC is an alternative AFM cantilever type for contact mode applications. The length of AFM cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode AFM probes for some AFM instruments. Additionally, this AFM probe type allows the application for lateral or friction force mode.

The AFM probe offers unique features:

  • guaranteed AFM tip radius of curvature < 10 nm
  • AFM tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series
This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.