PPP-FMR

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 75 45 - 115
Force Constant [N/m] 2.8 0.5 - 9.5
Length [µm] 225 215 - 235
Mean Width [µm] 28 20 - 35
Thickness [µm] 3 2 - 4
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-FMR-10 10 of all probes
PPP-FMR-20 20 of all probes
PPP-FMR-50 50
PPP-FMR-W 380 of up to 32 probes
NANOSENSORS™ PointProbe® Plus AFM Probes

PointProbe® Plus Force Modulation Mode - Reflex Coating

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined AFM tip shape. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The PPP-FM probe serves also as a basis for magnetic coatings (MFM). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The AFM probe offers unique features:

  • guaranteed AFM tip radius of curvature < 10 nm
  • AFM tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of AFM cantilever
  • high mechanical Q-factor for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the AFM cantilever length.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.