PPP-XYCONTR

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 13 6 - 21
Force Constant [N/m] 0.2 0.02 - 0.77
Length [µm] 450 440 - 460
Mean Width [µm] 50 42.5 - 57.5
Thickness [µm] 2 1 - 3
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-XYCONTR-10 10 of all probes
PPP-XYCONTR-20 20 of all probes
PPP-XYCONTR-50 50
NANOSENSORS™ XY-Alignment Series

PointProbe® Plus XY-alignment Contact Mode Reflex Coating

The XY-auto-alignment probes for Contact mode application with a Reflex coating extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to 450 µm long AFM cantilevers optimized for contact mode applications. AFM probe exchange with an AFM tip repositioning accuracy of better than ± 8 µm is possible for all AFM probes of the XY-alignment AFM probes series - independent of their AFM cantilever length. This series is adjusted to the AFM tip position of probes with an AFM cantilever length of 225 µm.

As a matter of course, the features of the proven Point Probe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible AFM tip radius as well as a precisely defined AFM tip shape are maintained. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. The virtually stress-free coating is bending the AFM cantilever less than 3.5% of the AFM cantilever length.

The AFM probe offers unique features:

  • guaranteed AFM tip radius of curvature < 10 nm
  • AFM tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of AFM cantilever
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • AFM tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)
This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.