SSS-NCL

SuperSharpSilicon™ - Non-Contact / Tapping Mode - Long Cantilever

NANOSENSORS™ SSS-NCL probes are designed for non-contact mode or tapping mode AFM. It is offered as an alternative to the NANOSENSORS™ high frequency non contact type (NCH). The SSS-NCL is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The probe offers unique features:

  • guaranteed tip radius of curvature < 5 nm
  • typical tip radius of curvature of 2 nm
  • typical aspect ratio at 200 nm from tip apex in the order of 4:1
  • half cone angle at 200 nm from apex < 10°
  • monolithic material
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series
Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency / kHz 190 146 - 196
Force Constant /(N/m) 48 21 - 98
Length /µm 225 215 - 235
Mean Width /µm 38 30 - 45
Thickness /µm 7 6 - 8
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
SSS-NCL-10 10 of all probes
SSS-NCL-20 20 of all probes
SSS-NCL-50 50

Special handling information for NANOSENSORS™

Due to their unique geometry the tips of the are more susceptible to tip damage by electrostatic discharge (ESD) than other Silicon-SPM-Probes.

Electric fields near the probe chip may lead to field evaporation which can blunt the tip apex of the probe tip. Therefore the NANOSENSORS™ are shipped in specially designed ESD-safe chip carriers.

NANOSENSORS™ recommends to their customers to take appropriate precautions to avoid tip damage due to electrostatic discharge when handling the probes. This can for example be done by using anti-electrostatic mats, wrist bands and tweezers.

NANOSENSORS SuperSharpSilicon