PPP-CONTPt

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 13 6 - 21
Force Constant [N/m] 0.2 0.02 - 0.77
Length [µm] 450 440 - 460
Mean Width [µm] 50 42.5 - 57.5
Thickness [µm] 2 1 - 3
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-CONTPt-10 10 of all probes
PPP-CONTPt-20 20 of all probes
PPP-CONTPt-50 50
PPP-CONTPt-W 380 of up to 32 probes
NANOSENSORS™ PointProbe® Plus AFM Probes

PointProbe® Plus Contact Mode - PtIr5 Coating

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible AFM tip radius as well as a more defined AFM tip shape. The minimized variation in AFM tip shape provides more reproducible images.

NANOSENSORS™ PPP-CONTPt AFM probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The PPP-CONTPt type is optimized for high sensitivity due to a low force constant.

The AFM probe offers unique features:

  • radius of curvature better than 25 nm
  • AFM tip height 10 - 15 µm
  • metallic conductivity of the AFM tip
  • high mechanical Q-factor for high sensitivity

The PtIr5 coating is an approximately 25 nm thick double layer of chromium and platinum iridium5 on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation and wear resistance. The bending of the AFM cantilever due to stress is less than 3.5% of the AFM cantilever length.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.