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PPP-CONTPt
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PPP-CONTPt

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 13 6 - 21
Force Constant [N/m] 0.2 0.02 - 0.77
Length [µm] 450 440 - 460
Mean Width [µm] 50 42.5 - 57.5
Thickness [µm] 2 1 - 3
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-CONTPt-10 10 of all probes
PPP-CONTPt-20 20 of all probes
PPP-CONTPt-50 50
PPP-CONTPt-W 380 of up to 32 probes
PointProbe® Plus AFM tip side view
PointProbe® Plus AFM tip side view
PointProbe® Plus AFM tip front view
PointProbe® Plus AFM tip front view
NANOSENSORS™ PointProbe® Plus AFM Probes

PointProbe® Plus Contact Mode - PtIr5 Coating

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORS™ PPP-CONTPt AFM probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The PPP-CONTPt type is optimized for high sensitivity due to a low force constant.

The AFM probe offers unique features:

  • radius of curvature better than 25 nm
  • AFM tip height 10 - 15 µm
  • metallic conductivity of the AFM tip
  • high mechanical Q-factor for high sensitivity

The PtIr5 coating is an approximately 25 nm thick double layer of chromium and platinum iridium5 on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation and wear resistance. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

How to optimize AFM scanning parameters: list-img

Ahmed S, Jindra SA, Higgins SR
Experimental Studies of Barite (001) Growth in Alkali Metal Salt Solutions at 108° C
The Journal of Physical Chemistry C. 2025 Aug 28
DOI: https://doi.org/10.1021/acs.jpcc.5c03047


Yamasue K, Takano K, Ishizuka T, Cho Y
Insulating tip for scanning near-field microwave microscopes: Application to van der Waals semiconductor imaging
Applied Physics Letters. 2025 Jun 16;126(24)
DOI: https://doi.org/10.1063/5.0268493


Lee H, Park Y, Nah S, Kang M, Lee M, Park JY
Reconfiguring hot-hole flux via polarity modulation of p-GaN in plasmonic Schottky architectures
Science advances. 2025 Mar 7;11(10):eadu0086
DOI: https://doi.org/10.1126/sciadv.adu0086


Zhang X, Yarman A, Kovács N, Bognár Z, Gyurcsányi RE, Bier FF, Scheller FW
Specific features of epitope-MIPs and whole-protein MIPs as illustrated for AFP and RBD of SARS-CoV-2
Microchimica Acta. 2024 May;191(5):242
DOI: https://doi.org/10.1007/s00604-024-06325-0


Yang TH, Liang BW, Hu HC, Chen FX, Ho SZ, Chang WH, Yang L, Lo HC, Kuo TH, Chen JH, Lin PY
Ferroelectric transistors based on shear-transformation-mediated rhombohedral-stacked molybdenum disulfide
Nature Electronics. 2024 Jan;7(1):29-38
DOI: https://doi.org/10.1038/s41928-023-01073-0


Schmidt N, Kaiser N, Vogel T, Piros E, Karthäuser S, Waser R, Alff L, Dittmann R
Impact of Non‐Stoichiometric Phases and Grain Boundaries on the Nanoscale Forming and Switching of HfOx Thin Films
Advanced Electronic Materials. 2024 Apr;10(4):2300693
DOI: https://doi.org/10.1002/aelm.202300693


Rodenbücher C, Bihlmayer G, Korte C, Rytz D, Szade J, Szot K.
An Operando Study of the Thermal Reduction of BaTiO3 Crystals: The Nature of the Insulator–Metal Transition of the Surface Layer
Crystals. 2023 Aug 19;13(8):1278.
DOI: https://doi.org/10.3390/cryst13081278


Zhang C, Lu W, Xu Y, Zeng K, Ho GW
Mechanistic formulation of inorganic membranes at the air–liquid interface
Nature. 2023 Apr 13;616(7956):293-9.
DOI: https://doi.org/10.1038/s41586-023-05809-y


Kim J, Kim W, Kim J, Sohn H
Locally formed conductive filaments in an amorphous Ga2Te3 ovonic threshold switching device
AIP Advances. 2023 Mar 1;13(3)
DOI: https://doi.org/10.1063/5.0140715


Pilch MM, Rodenbücher C, Krok F, Szot K
Heterogeneity in La Distribution in Highly La-Doped SrTiO3 Crystals
Crystals. 2023 Oct 30;13(11):1552
DOI: https://doi.org/10.3390/cryst13111552


Ishizuka T, Yamasue K, Cho Y
Local capacitance-voltage profiling on MoS 2/SiO 2 and MoS 2/h-BN/SiO 2 by scanning nonlinear dielectric microscopy assisted with an insulating tip
In2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) 2022 Mar 6 (pp. 223-225). IEEE
DOI: https://doi.org/10.1109/EDTM53872.2022.9798093


Antonets IV, Golubev YA, Shcheglov VI
Evaluation of microstructure and conductivity of two-phase materials by the scanning spreading resistance microscopy (the case of shungite)
Ultramicroscopy. 2021 Mar 1;222:113212
DOI: https://doi.org/10.1016/j.ultramic.2021.113212


Ficek M, Głowacki MJ, Gajewski K, Kunicki P, Gacka E, Sycz K, Mrózek M, Wojciechowski AM, Gotszalk TP, Gawlik W, Bogdanowicz R
Integration of fluorescent, NV-rich nanodiamond particles with AFM cantilevers by focused ion beam for hybrid optical and micromechanical devices
Coatings. 2021 Oct 29;11(11):1332
DOI: https://doi.org/10.3390/coatings11111332


Park Y, Choi J, Kang M, Lee H, Ihee H, Park JY
Relaxation dynamics of enhanced hot-electron flow on perovskite-coupled plasmonic silver schottky nanodiodes
The Journal of Physical Chemistry C. 2021 Jan 25;125(4):2575-82
DOI: https://doi.org/10.1021/acs.jpcc.1c00033


Sun Y, Li T, Sun Q, Cheng Y, Zeng K
Chain substitution caused sub-fibril level differences in electromechanical structure and property of wild-type and oim/oim collagen fibers
Journal of Applied Physics. 2020 Dec 21;128(23)
DOI: https://doi.org/10.1063/5.0016535


Belza W, Szajna K, Kratzer M, Wrana D, Cieslik K, Krawiec M, Teichert C, Krok F
Molecular structure and electronic properties of para-hexaphenyl monolayer on atomically flat rutile TiO2 (110).
The Journal of Physical Chemistry C. 2020 Feb 13;124(10):5681-9
DOI: https://doi.org/10.1021/acs.jpcc.9b11533


An K, Rhee S, Lee H, Kang KT, Lee C, Kwak J
Direct observation of crystal engineering in perovskite solar cells in a moisture-free environment using conductive atomic force microscopy and friction force microscopy.
The Journal of Physical Chemistry C. 2020 Feb 11;124(9):4946-52
DOI: https://doi.org/10.1021/acs.jpcc.9b09768


Sharafutdinova LA, Zamula YS, Khismatullina ZR, Daminov MR, Valiullin VV
Structural and Biomechanical Characteristics of Blood Neutrophils on the Background of Exposure to Titanium Dioxide Nanoparticles (an atomic force microscopy study)
Neuroscience and Behavioral Physiology. 2019 Jul 15;49(6):791-6
DOI: https://doi.org/10.1007/s11055-019-00803-2


Chen S, Noori S, Villena MA, Shi Y, Han T, Zuo Y, Pedeferri M, Strukov D, Lanza M, Diamanti MV
Memristive electronic synapses made by anodic oxidation
Chemistry of Materials. 2019 Sep 20;31(20):8394-401
DOI: https://doi.org/10.1021/acs.chemmater.9b02245


Rodenbücher C, Bihlmayer G, Speier W, Kubacki J, Wojtyniak M, Rogala M, Wrana D, Krok F, Szot K
Local surface conductivity of transition metal oxides mapped with true atomic resolution.
Nanoscale. 2018;10(24):11498-505
DOI: https://doi.org/10.1039/C8NR02562B


Bernard L, Khikhlovskyi V, van Breemen A, Michels JJ, Janssen R, Kemerink M, Gelinck G, Pilet N
Study of the morphology of organic ferroelectric diodes with combined scanning force and scanning transmission X-ray microscopy.
Organic Electronics. 2018 Feb 1;53:242-8
DOI: https://doi.org/10.1016/j.orgel.2017.11.012


Zhang T, Hui Y, Chen L, Li G, Mao B, Zhao Y
Interfacial crosslinked quasi-2D perovskite with boosted carrier transport and enhanced stability
Journal of Physics D: Applied Physics. 2018 Aug 21;51(40):404001
DOI: https://doi.org/10.1088/1361-6463/aad7de


Liu KY, Baek JD, Ng CS, Su PC
Improving thermal stability of nanoporous platinum cathode at platinum/yttria-stabilized zirconia interface by oxygen plasma treatment
Journal of Power Sources. 2018 Aug 31;396:73-9
DOI: https://doi.org/10.1016/j.jpowsour.2018.06.018


Letertre L, Douhéret O, Bougouma M, Doneux T, Lazzaroni R, Buess-Herman C, Leclère P
Nanoscale study of MoSe2/poly (3-hexylthiophene) bulk heterojunctions for hybrid photovoltaic applications.
Solar Energy Materials and Solar Cells. 2016 Feb 1;145:116-25
DOI: https://doi.org/10.1016/j.solmat.2015.08.027


Mishchenko A, Eckmann A, Grigorieva IV, Novoselov KS
Fluorination clusters on graphene resolved by conductive AFM
InNanomaterials for Security 2016 Jul 21 (pp. 19-24). Dordrecht: Springer Netherlands
DOI: https://doi.org/10.1007/978-94-017-7593-9_2


Müller S, Baumann RP, Geßner T, Weitz RT
Identification of grain boundaries as degradation site in n‐channel organic field‐effect transistors determined via conductive atomic force microscopy
physica status solidi (RRL)–Rapid Research Letters. 2016 Apr;10(4):339-45.B
DOI: https://doi.org/10.1002/pssr.201600008


Frascaroli J, Brivio S, Ferrarese Lupi F, Seguini G, Boarino L, Perego M, Spiga S.
Resistive switching in high-density nanodevices fabricated by block copolymer self-assembly
ACS nano. 2015 Mar 24;9(3):2518-29
DOI: https://doi.org/10.1021/nn505131b


Lanza M, Bayerl A, Gao T, Porti M, Nafria M, Jing GY, Zhang YF, Liu ZF, Duan HL
Graphene‐Coated atomic force microscope tips for reliable nanoscale electrical characterization
Advanced Materials. 2013 Mar 13;25(10):1440-4
DOI: https://doi.org/10.1002/adma.201204380


Bolsée JC, Oosterbaan WD, Lutsen L, Vanderzande D, Manca J.
The importance of bridging points for charge transport in webs of conjugated polymer nanofibers
Advanced Functional Materials. 2013 Feb 18;23(7):862-9
DOI: https://doi.org/10.1002/adfm.201102078


Felten A, Flavel BS, Britnell L, Eckmann A, Louette P, Pireaux JJ, Hirtz M, Krupke R, Casiraghi C
Single‐and Double‐Sided Chemical Functionalization of Bilayer Graphene
Small. 2013 Feb 25;9(4):631-9
DOI: https://doi.org/10.1002/smll.201202214


Eckmann A, Felten A, Mishchenko A, Britnell L, Krupke R, Novoselov KS, Casiraghi C
Probing the nature of defects in graphene by Raman spectroscopy
Nano letters. 2012 Aug 8;12(8):3925-30
DOI: https://doi.org/10.1021/nl300901a


Wojtyniak M, Szot K, Waser R
The thermal stability of Pt/Ir coated AFM tips for resistive switching measurements
Applied surface science. 2011 Jun 15;257(17):7627-32
DOI: https://doi.org/10.1016/j.apsusc.2011.03.149


Cardellach M, Verdaguer A, Fraxedas J
Defect-induced wetting on BaF2 (111) and CaF2 (111) at ambient conditions
Surface science. 2011 Dec 1;605(23-24):1929-33
DOI: https://doi.org/10.1016/j.susc.2011.07.003