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| Property | Nominal Value | Specified Range |
|---|---|---|
| Resonance Frequency [kHz] | 130 | 96 - 175 |
| Force Constant [N/m] | 15 | 5 - 37 |
| Length [µm] | 225 | 215 - 235 |
| Mean Width [µm] | 33 | 30 - 45 |
| Thickness [µm] | 5 | 4 - 6 |
| Order Code | AFM probes per pack | Data sheet |
|---|---|---|
| SSS-SEIH-10 | 10 | of all probes |
| SSS-SEIH-20 | 20 | of all probes |
| SSS-SEIH-50 | 50 |
Due to their unique geometry the tips of the are more susceptible to tip damage by electrostatic discharge (ESD) than other Silicon-SPM-Probes.
Electric fields near the probe chip may lead to field evaporation which can blunt the tip apex of the probe tip. Therefore the NANOSENSORS™ are shipped in specially designed ESD-safe chip carriers.
NANOSENSORS™ recommends to their customers to take appropriate precautions to avoid tip damage due to electrostatic discharge when handling the probes. This can for example be done by using anti-electrostatic mats, wrist bands and tweezers.
For owners of a Seiko Instruments microscope using the non-contact mode we recommend the NANOSENSORS™ SEIH type (Seiko Instruments / high force constant). Compared with the ZEIH type the force constant is further reduced.
For enhanced resolution of nanostructures and microroughness we offer our Super SharpSilicon™ AFM tip with unrivalled sharpness.
