Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - Au coating (Detector side)
The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-NCLAuD probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PPP-NCLAuD is recommended if the feedback loop of the microscope does not accept high frequencies (400kHz) or if the detection system needs a minimum cantilever length >125µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
The probe offers unique features:
- guaranteed tip radius of curvature < 10 nm
- tip height 10 - 15 µm
- highly doped silicon to dissipate static charge
- Au coating on detector side of cantilever
- chemically inert
A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.