PPP-NCLAuD

Point Probe® Plus Non-Contact /Tapping Mode - Long Cantilever - Au coating (Detector side)

The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCLAuD probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PPP-NCLAuD is recommended if the feedback loop of the microscope does not accept high frequencies (400kHz) or if the detection system needs a minimum cantilever length >125µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

The probe offers unique features:

  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • Au coating on detector side of cantilever
  • chemically inert

A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency / kHz 190 146 - 236
Force Constant /(N/m) 48 21 - 98
Length /µm 225 215 - 235
Mean Width /µm 38 30 - 45
Thickness /µm 7 6 - 8
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-NCLAuD-10 10 of all probes
NANOSENSORS™ PointProbe® Plus AFM Probes