PPP-FMAu

PointProbe® Plus Force Modulation Mode - Au coating

The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images.

NANOSENSORS™ PPP-FMAu is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The probe offers unique features:

  • metallic conductivity of the tip
  • tip height 10 - 15 µm
  • Au coating on both sides of the cantilever
  • chemically inert

A metallic layer (Au) is coated on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts - the typical tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the cantilever. The coating process is optimized for stress compensation. The bending of the cantilever due to stress is less than 3.5% of the cantilever length.

Please note: Wear at the tip can occur if operating in contact-, friction- or force modulation mode.

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency / kHz 75 45 - 115
Force Constant /(N/m) 2.8 0.5 - 9.5
Length /µm 225 215 - 235
Mean Width /µm 28 20 - 35
Thickness /µm 3 2 - 4
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-FMAu-10 10 of all probes
NANOSENSORS™ PointProbe® Plus AFM Probes