PPP-FMAu

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 75 45 - 115
Force Constant [N/m] 2.8 0.5 - 9.5
Length [µm] 225 215 - 235
Mean Width [µm] 28 20 - 35
Thickness [µm] 3 2 - 4
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-FMAu-10 10 of all probes
NANOSENSORS™ PointProbe® Plus AFM Probes

PointProbe® Plus Force Modulation Mode - Au coating

The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible AFM tip radius as well as a more defined AFM tip shape. The minimized variation in AFM tip shape provides more reproducible images.

NANOSENSORS™ PPP-FMAu is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The AFM probe offers unique features:

  • metallic conductivity of the AFM tip
  • AFM tip height 10 - 15 µm
  • Au coating on both sides of the AFM cantilever
  • chemically inert

A metallic layer (Au) is coated on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts - the typical AFM tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation. The bending of the AFM cantilever due to stress is less than 3.5% of the AFM cantilever length.

Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.