PointProbe® Plus Force Modulation Mode - Au coating
The Point Probe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.
NANOSENSORS™ PPP-FMAu is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.
The AFM probe offers unique features:
- metallic conductivity of the AFM tip
- AFM tip height 10 - 15 µm
- Au coating on both sides of the AFM cantilever
- chemically inert
A metallic layer (Au) is coated on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts - the typical AFM tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.
Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.
This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.