Nanosensors logo

PointProbe® Plus SEIKO microscopes - Non-Contact / Tapping Mode High Force Constant - Reflex Coating

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible AFM tip radius as well as a more defined AFM tip shape. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.

For owners of a Seiko Instruments microscope using the non-contact mode we recommend NANOSENSORS™ PPP-SEIHR AFM probes (Seiko Instruments / high force constant). Compared with the ZEIHR type the force constant is further reduced.

The AFM probe offers unique features:

• guaranteed AFM tip radius of curvature < 10 nm
• AFM tip height 10 - 15 µm
• highly doped silicon to dissipate static charge
• Al coating on detector side of AFM cantilever
• high mechanical Q-factor for high sensitivity
• alignment grooves on backside of silicon holder chip
• precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
• compatible with PointProbe® Plus XY-Alignment Series

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. The virtually stress-free coating is bending the AFM cantilever less than 2% of the AFM cantilever length.