PPP-NCH

PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCH AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

The probe offers unique features:

  • guaranteed tip radius of curvature < 10nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity
Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency / kHz 330 204 - 497
Force Constant /(N/m) 42 10 - 130
Length /µm 125 115 - 135
Mean Width /µm 30 22.5 - 37.5
Thickness /µm 4 3 - 5
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-NCH-10 10 of all probes
PPP-NCH-20 20 of all probes
PPP-NCH-50 50
PPP-NCH-W 380 of up to 32 probes
NANOSENSORS™ PointProbe® Plus AFM Probes