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| Property | Nominal Value | Specified Range |
|---|---|---|
| Resonance Frequency [kHz] | 23 | 1 - 57 |
| Force Constant [N/m] | 0.2 | 0.01 - 1.87 |
| Length [µm] | 225 | 215 - 235 |
| Mean Width [µm] | 48 | 40 - 55 |
| Thickness [µm] | 1 | 0.1 - 2 |
| Order Code | AFM probes per pack | Data sheet |
|---|---|---|
| PPP-LFMR-10 | 10 | of all probes |
| PPP-LFMR-20 | 20 | of all probes |
| PPP-LFMR-50 | 50 | |
| PPP-LFMR-W | 380 | of up to 32 probes |
The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.
For lateral or friction force microscopy NANOSENSORS™ offers a special type of AFM probe (LFM: lateral force microscopy). This sensor type is optimized for a high sensitivity to lateral or friction forces by an extremely soft, thin AFM cantilever
The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.
This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.
