Mathias T, Bennewitz R, Egberts P
Mechanical property measurements enabled by short-term Fourier-transform of atomic force microscopy thermal deflection analysis
Beilstein Journal of Nanotechnology. 2025 Nov 6;16(1):1952-62
DOI: https://doi.org/10.3762/bjnano.16.136
Millan-Solsona R, Ruiz-Torres JA, Moya C, Rodríguez AF, Figueroa AI, Gomila G, Labarta A, Batlle X
Single-particle detection of a semiconductor-to-metal transition by scanning dielectric microscopy.
arXiv preprint arXiv:2511.02545. 2025 Nov 4
DOI: https://doi.org/10.48550/arXiv.2511.02545
Han Y, Thebault PM, Audes C, Wang X, Park H, Jiang JZ, Caron A
Temperature and chemical effects on the interfacial energy between a Ga–In–Sn eutectic liquid alloy and nanoscopic asperities
Beilstein Journal of Nanotechnology. 2022 Aug 23;13(1):817-27
DOI: https://doi.org/10.3762/bjnano.13.72
Lozano H, Millan-Solsona R, Blanco-Cabra N, Fabregas R, Torrents E, Gomila G
Electrical properties of outer membrane extensions from Shewanella oneidensis MR-1
Nanoscale. 2021;13(44):18754-62
DOI: https://doi.org/10.1039/D1NR04689F
Xie S, Dey A, Yan W, Kudrynskyi ZR, Balakrishnan N, Makarovsky O, Kovalyuk ZD, Castanon EG, Kolosov O, Wang K, Patanè A
Ferroelectric semiconductor junctions based on graphene/In2Se3/graphene van der Waals heterostructures
2D Materials. 2021 Aug 20;8(4):045020
DOI: https://doi.org/10.1088/2053-1583/ac1ada
Boschker HT, Cook PL, Polerecky L, Eachambadi RT, Lozano H, Hidalgo-Martinez S, Khalenkow D, Spampinato V, Claes N, Kundu P, Wang D
Efficient long-range conduction in cable bacteria through nickel protein wires
Nature communications. 2021 Jun 28;12(1):3996
DOI: https://doi.org/10.1038/s41467-021-24312-4
Colvin J, Ciechonski R, Gustafsson A, Samuelson L, Ohlsson BJ, Timm R
Local defect-enhanced anodic oxidation of reformed GaN nanowires
Physical Review Materials. 2020 Jul;4(7):074603
DOI: https://doi.org/10.1103/PhysRevMaterials.4.074603
Caballero-Quintana I, Amargós-Reyes O, Maldonado JL, Nicasio-Collazo J, Romero-Borja D, Barreiro-Argüelles D, Molnár G, Bousseksou A.
Scanning probe microscopy analysis of nonfullerene organic solar cells
ACS Applied Materials & Interfaces. 2020 May 29;12(26):29520-7
DOI: https://doi.org/10.1021/acsami.0c06048
Oh YC, Kwon SK, Minkow A, Park HW, Kim SH, Fecht HJ, Caron A.
Effect of crystallographic orientation on the friction of copper and graphenized copper
Journal of Materials Science. 2020 Dec;55(34):16432-50
DOI: https://doi.org/10.1007/s10853-020-05178-1
Toth D, Hailegnaw B, Richheimer F, Castro FA, Kienberger F, Scharber MC, Wood S, Gramse G
Nanoscale charge accumulation and its effect on carrier dynamics in tri-cation perovskite structures
ACS Applied materials & interfaces. 2020 Sep 24;12(42):48057-66
DOI: https://doi.org/10.1021/acsami.0c10641
Colvin J, Ciechonski R, Lenrick F, Hultin O, Khalilian M, Mikkelsen A, Gustafsson A, Samuelson L, Timm R, Ohlsson BJ
Surface and dislocation investigation of planar GaN formed by crystal reformation of nanowire arrays
Physical Review Materials. 2019 Sep;3(9):093604
DOI: https://doi.org/10.1103/PhysRevMaterials.3.093604
Lozano H, Millán-Solsona R, Fabregas R, Gomila G
Sizing single nanoscale objects from polarization forces
Scientific Reports. 2019 Oct 2;9(1):14142
DOI: https://doi.org/10.1038/s41598-019-50745-5
Lozano H, Fabregas R, Blanco-Cabra N, Millán-Solsona R, Torrents E, Fumagalli L, Gomila G
Dielectric constant of flagellin proteins measured by scanning dielectric microscopy
Nanoscale. 2018;10(40):19188-94
DOI: https://doi.org/10.1039/C8NR06190D
Kollath VO, Arjmand M, Egberts P, Sundararaj U, Karan K
Quantitative analysis of nanoscale electrical properties of CNT/PVDF nanocomposites by current sensing AFM
Rsc Advances. 2017;7(52):32564-73
DOI: https://doi.org/10.1039/C7RA05640K
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