Platinum Silicide Probes Contact Mode
NANOSENSORS™ PtSi-CONT are designed for contact mode (repulsive mode) AFM imaging. Furthermore this AFM probe can be used for force-distance spectroscopy or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due a low force constant.
For applications that require a wear resistant and electrically conductive AFM tip we recommend this type. NANOSENSORS™ PtSi-CONT are suitable for C-AFM, Tunneling AFM (TUNA) and Scanning Capacitance Microscopy (SCM).
The AFM probe offers unique features:
- platinum silicide coating with excellent conductivity and good wear-out behaviour
- chemically inert
- high mechanical Q-factor for high sensitivity
- alignement grooves on backside of the holder chip
- compatible with PointProbe® Plus XY-Alignment Series
This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.