SSS-MFMR

Cantilever data:

Property	Nominal Value	Specified Range
Resonance Frequency [kHz]	75	45 - 115
Force Constant [N/m]	2.8	0.5 - 9.5
Length [µm]	225	215 - 235
Mean Width [µm]	28	20 - 35
Thickness [µm]	3	2 - 4

Order codes and shipping units:

Order Code	AFM probes per pack	Data sheet
SSS-MFMR-10	10	of all probes
SSS-MFMR-20	20	of all probes
SSS-MFMR-50	50

Special handling information for NANOSENSORS™

Due to their unique geometry the tips of the are more susceptible to tip damage by electrostatic discharge (ESD) than other Silicon-SPM-Probes.

Electric fields near the probe chip may lead to field evaporation which can blunt the tip apex of the probe tip. Therefore the NANOSENSORS™ are shipped in specially designed ESD-safe chip carriers.

NANOSENSORS™ recommends to their customers to take appropriate precautions to avoid tip damage due to electrostatic discharge when handling the probes. This can for example be done by using anti-electrostatic mats, wrist bands and tweezers.

SuperSharpSilicon MFM AFM tip closeup

PointProbe® Plus AFM tip front view

NANOSENSORS™ Magnetic Force Microscopy MFM Silicon Probes

SuperSharpSilicon™ Magnetic Force Microscopy - Reflex Coating

The NANOSENSORS™ SSS-MFMR AFM probe is optimized for high resolution magnetic force imaging. The SuperSharpSilicon™ AFM tip basis combined with a very thin hard magnetic coating result in an extremely small radius of the coated AFM tip and a high aspect ratio at the last few hundred nanometers of the AFM tip - the essential demands for high lateral resolution down to 20 nm in ambient conditions.

Due to the low magnetic moment of the AFM tip the sensitivity to magnetic forces is significantly decreased if compared to standard MFM probes but the disturbance of soft magnetic samples is also reduced.

The hard magnetic coating on the AFM tip is characterized by a coercivity of app. 125 Oe and a remanence magnetization of app. 80 emu/cm³ (these values were determined on a flat surface).

The SPM probe offers unique features:

hard magnetic coating on the tip side (coercivity of app. 125 Oe, remanence magnetization of app. 80 emu/cm³)
effective magnetic moment 0.25x of standard AFM probes
metallic electrical conductivity
guaranteed AFM tip radius of curvature < 15 nm
magnetic resolution better than 25 nm
Al coating on detector side of AFM cantilever enhancing the reflectivity of the laser beam by a factor of about 2.5
alignment grooves on backside of silicon holder chip
precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
compatible with PointProbe® Plus XY-Alignment Series

As both coatings are almost stress-free the bending of the AFM cantilever due to stress is less than 3.5% of the AFM cantilever length. For enhanced signal strength the magnetization of the AFM tip by means of a strong permanent magnet prior to the measurement is recommended.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

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