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PPP-CONTSCPt
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PPP-CONTSCPt

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 25 1 - 57
Force Constant [N/m] 0.2 0.01 - 1.87
Length [µm] 225 215 - 235
Mean Width [µm] 48 40 - 55
Thickness [µm] 1 0.1 - 2
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-CONTSCPt-10 10 of all probes
PPP-CONTSCPt-20 20 of all probes
PPP-CONTSCPt-50 50
PointProbe® Plus AFM tip front view
PointProbe® Plus AFM tip front view
PointProbe® Plus AFM tip closeup
PointProbe® Plus AFM tip closeup
NANOSENSORS™ PointProbe® Plus AFM Probes

PointProbe® Plus Contact Mode Short Cantilever -PtIr5 Coating

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

The NANOSENSORS™ PPP-CONTSCPt is an alternative AFM cantilever type for contact mode applications. The length of AFM cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode AFM probes for some AFM instruments. Additionally, this AFM probe type allows the application for lateral or friction force mode.

The AFM probe offers unique features:

  • metallic conductivity of the AFM tip
  • radius of curvature better than 25 nm
  • AFM tip height 10 - 15 µm
  • high mechanical Q-factor for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

The PtIr5 coating is an approximately 25 nm thick double layer of chromium and platinum iridium5 on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation and wear resistance. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

How to optimize AFM scanning parameters: list-img

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