SSS-SEIHR

SuperSharpSilicon™ - SEIKO Microscopes - Non-Contact / Tapping Mode - High Force Constant - Reflex Coating

For owners of a Seiko Instruments microscope using the non-contact mode we recommend the NANOSENSORS™ SEIH type (Seiko Instruments / high force constant). Compared with the ZEIH type the force constant is further reduced.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The probe offers unique features:

  • guaranteed tip radius of curvature < 5 nm
  • typical tip radius of curvature of 2 nm
  • typical aspect ratio at 200 nm from tip apex in the order of 4:1
  • half cone angle at 200 nm from apex < 10°
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

How to optimize AFM scanning parameters: list-img
Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 130 96 - 175
Force Constant [N/m] 15 5 - 37
Length [µm] 225 215 - 235
Mean Width [µm] 33 30 - 45
Thickness [µm] 5 4 - 6
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
SSS-SEIHR-10 10 of all probes
SSS-SEIHR-20 20 of all probes
SSS-SEIHR-50 50

Special handling information for NANOSENSORS™

Due to their unique geometry the tips of the are more susceptible to tip damage by electrostatic discharge (ESD) than other Silicon-SPM-Probes.

Electric fields near the probe chip may lead to field evaporation which can blunt the tip apex of the probe tip. Therefore the NANOSENSORS™ are shipped in specially designed ESD-safe chip carriers.

NANOSENSORS™ recommends to their customers to take appropriate precautions to avoid tip damage due to electrostatic discharge when handling the probes. This can for example be done by using anti-electrostatic mats, wrist bands and tweezers.

NANOSENSORS™ SuperSharpSilicon