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PPP-NCSTAuD
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PPP-NCSTAuD

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 160 75 - 265
Force Constant [N/m] 7.4 1.2 - 29
Length [µm] 150 140 - 160
Mean Width [µm] 27 19.5 - 34.5
Thickness [µm] 2.8 1.8 - 3.8
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-NCSTAuD-10 10 of all probes
PointProbe® Plus AFM tip front view
PointProbe® Plus AFM tip front view
PointProbe® Plus AFM tip closeup
PointProbe® Plus AFM tip closeup
NANOSENSORS™ PointProbe® Plus AFM Probes

PointProbe® Plus Non-Contact / Soft Tapping Mode - Au Coating (Detector side)

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCSTAuD AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft AFM cantilever and fairly high resonance frequency enables stable and fast measurements with reduced AFM tip-sample interaction. This feature significantly reduces AFM tip wear and sample wear at the same time.

The AFM probe offers unique features:

  • guaranteed AFM tip radius of curvature < 10 nm
  • AFM tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • Au coating on detector side of AFM cantilever
  • chemically inert

A metallic layer (Au) is coated on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

How to optimize AFM scanning parameters: list-img

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