PPP-NCSTAuD

PointProbe® Plus Non-Contact / Soft Tapping Mode - Au Coating (Detector side)

The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCSTAuD AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time.

The probe offers unique features:

  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • Au coating on detector side of cantilever
  • chemically inert

A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

How to optimize AFM scanning parameters: list-img
Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 160 75 - 265
Force Constant [N/m] 7.4 1.2 - 29
Length [µm] 150 140 - 160
Mean Width [µm] 27 19.5 - 34.5
Thickness [µm] 2.8 1.8 - 3.8
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-NCSTAuD-10 10 of all probes
NANOSENSORS™ PointProbe® Plus AFM Probes