Nanosensors logo
| Property | Nominal Value | Specified Range |
|---|---|---|
| Resonance Frequency [kHz] | 13 | 6 - 21 |
| Force Constant [N/m] | 0.2 | 0.02 - 0.77 |
| Length [µm] | 450 | 440 - 460 |
| Mean Width [µm] | 50 | 42.5 - 57.5 |
| Thickness [µm] | 2 | 1 - 3 |
| Order Code | AFM probes per pack | Data sheet |
|---|---|---|
| PPP-CONTAuD-10 | 10 | of all probes |
The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.
NANOSENSORS™ PPP-CONTAuD probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
A metallic layer (Au) is coated on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.
This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.
