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| Property | Nominal Value | Specified Range |
|---|---|---|
| Resonance Frequency [kHz] | 330 | 204 - 497 |
| Force Constant [N/m] | 42 | 10 - 130 |
| Length [µm] | 125 | 115 - 135 |
| Mean Width [µm] | 30 | 22.5 - 37.5 |
| Thickness [µm] | 4 | 3 - 5 |
| Order Code | AFM probes per pack | Data sheet |
|---|---|---|
| AR5T-NCHR-10 | 10 | of all probes |
| AR5T-NCHR-20 | 20 | of all probes |
| AR5T-NCHR-50 | 50 | |
| AR5T-NCHR-W | 370 |
Due to their unique geometry the tips of the are more susceptible to tip damage by electrostatic discharge (ESD) than other Silicon-SPM-Probes.
Electric fields near the probe chip may lead to field evaporation which can blunt the tip apex of the probe tip. Therefore the NANOSENSORS™ are shipped in specially designed ESD-safe chip carriers.
NANOSENSORS™ recommends to their customers to take appropriate precautions to avoid tip damage due to electrostatic discharge when handling the probes. This can for example be done by using anti-electrostatic mats, wrist bands and tweezers.
NANOSENSORS™ AR5T-NCHR sensors are designed for non-contact mode or Tapping Mode AFM (also known as: attractive or dynamic mode). This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability.
For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored AFM tips. These AFM tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion at the end of the common silicon AFM tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the AFM tip.
On the model AR5T the last 2 µm of the AFM tip are tilted 13° to the center axis of the AFM cantilever. With this feature the tilt angle of the AFM cantilever caused by the mount of the AFM head (commonly 13°) will be compensated. Now, nearly vertical sidewalls can be measured offering a symmetrical scan.
The reflective coating is a 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.
This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.
