CDT-NCLR

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 210 155 - 275
Force Constant [N/m] 72 34 - 142
Length [µm] 225 215 - 235
Mean Width [µm] 37.5 30 - 45
Thickness [µm] 7 6 - 8
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
CDT-NCLR-10 10 of all probes
CDT-NCLR-20 20 of all probes
CDT-NCLR-50 50

Conductive Diamond Coated Tip - Non-Contact/Tapping Mode - Long cantilever - Reflex Coating

NANOSENSORS™ CDT-NCLR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to the NANOSENSORS™ high frequency non-contact type (NCH). The CDT-NCLR AFM probe is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum AFM cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability.

For applications that require a wear resistant and an electrically conductive AFM tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

The typical macroscopic AFM tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.

The AFM probe offers unique features:

  • real diamond coating, highly doped
  • AFM tip height 10 - 15 µm
  • high mechanical Q-factor for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. The virtually stress-free coating is bending the AFM cantilever less than 3.5% of the AFM cantilever length.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.