Conductive Diamond Coated Tip - Non-Contact/Tapping Mode - Long cantilever - Reflex Coating
NANOSENSORS™ CDT-NCLR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to the NANOSENSORS™ high frequency non-contact type (NCH). The CDT-NCLR probe is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability.
For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.
The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.
The probe offers unique features:
- real diamond coating, highly doped
- tip height 10 - 15 µm
- high mechanical Q-factor for high sensitivity
- alignment grooves on backside of silicon holder chip
- precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
- compatible with PointProbe® Plus XY-Alignment Series
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.