PtSi-FM

Platinum Silicide Probes Force Modulation Mode

NANOSENSORS™ PtSi-FM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For applications that require a wear resistant and an electrically conductive tip we recommend this type. NANOSENSORS PtSi-FM probes are suitable for C-AFM, Tunneling AFM, Scanning Capacitance Microscopy (SCM), Electrostatic Force Microscopy (EFM) and Kelvin Probe Force Microscopy (KFPM).

The Platinum Silicide coating shows an excellent conductivity (almost approaching metal conductivity). The typical tip radius of curvature is around 25 nm.

The probe offers unique features:
  • platinum silicide coating with excellent conductivity and good wear-out behavior
  • high mechanical Q-factor for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

 

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency / kHz 75 45 - 115
Force Constant /(N/m) 2.8 0.5 - 9.5
Length /µm 225 215 - 235
Mean Width /µm 28 20 - 35
Thickness /µm 3 2 - 4
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PtSi-FM-10 10 of all probes
PtSi-FM-20 20 of all probes
PtSi-FM-50 50
NANOSENSORS™ Platinum Silicide AFM Probes