PPP-NCSTAu

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 160 75 - 265
Force Constant [N/m] 7.4 1.2 - 29
Length [µm] 150 140 - 160
Mean Width [µm] 27 19.5 - 34.5
Thickness [µm] 2.8 1.8 - 3.8
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-NCSTAu-10 10 of all probes
NANOSENSORS™ PointProbe® Plus AFM Probes

PointProbe® Plus Non-Contact / Soft Tapping Mode - Au Coating

The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible AFM tip radius as well as a more defined AFM tip shape.

NANOSENSORS™ PPP-NCSTAu AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft AFM cantilever and fairly high resonance frequency enables stable and fast measurements with reduced AFM tip-sample interaction. This feature significantly reduces AFM tip wear and sample wear at the same time.

The AFM probe offers unique features:

  • metallic conductivity of the AFM tip
  • AFM tip height 10 - 15 µm
  • Au coating on both sides of the AFM cantilever
  • chemically inert
  • high mechanical Q-factor for high sensitivity

A metallic layer (Au) is coated on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts - the typical AFM tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation. The bending of the AFM cantilever due to stress is less than 3.5% of the AFM cantilever length.

Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.