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| Property | Nominal Value | Specified Range |
|---|---|---|
| Resonance Frequency [kHz] | 190 | 146 - 236 |
| Force Constant [N/m] | 48 | 21 - 98 |
| Length [µm] | 225 | 215 - 235 |
| Mean Width [µm] | 38 | 30 - 45 |
| Thickness [µm] | 7 | 6 - 8 |
| Order Code | AFM probes per pack | Data sheet |
|---|---|---|
| PPP-NCLAu-10 | 10 | of all probes |
The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.
NANOSENSORS™ PPP-NCLAu probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PPP-NCLAu is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum AFM cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
A metallic layer (Au) is coated on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts - the typical AFM tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.
Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation m
This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.
