PointProbe® Plus Non-Contact / Soft Tapping Mode

The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCST AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time

The probe offers unique features:

  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivit


Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency / kHz 160 75 - 265
Force Constant /(N/m) 7.4 1.2 - 29
Length /µm 150 140 - 160
Mean Width /µm 27 19.5 - 34.5
Thickness /µm 2.8 1.8 - 3.8
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-NCST-10 10 of all probes
PPP-NCST-20 20 of all probes
PPP-NCST-50 50
PPP-NCST-W 380 of up to 32 probes
NANOSENSORS™ PointProbe® Plus AFM Probes