SSS-QMFMR

SuperSharpSilicon™ - High Quality-Factor - Magnetic Force Microscopy - Reflex Coating

The NANOSENSORS™ SSS-QMFMR AFM probe combines the high resolution performance of the SuperSharpSilicon™ magnetic force microscopy probe with the high mechanical quality factor under ultra high vacuum conditions of the Q30K-Plus-Series. An extremely small radius of the coated tip, a high aspect ratio at the last few hundred nanometers of the tip and a Q-factor of more than 35,000 facilitates outstanding lateral resolution in the magnetic force image and high operation stability under UHV conditions.

Due to the low magnetic moment of the tip the sensitivity to magnetic forces is decreased if compared to standard MFM probe but the disturbance of soft magnetic samples is also reduced.

The hard magnetic coating on the tip is characterized by a coercivity of app. 125 Oe and a remanence magnetization of app. 80 emu/cm3 (these values were determined on a flat surface).

The SPM probe offers unique features:

  • hard magnetic coating on the tip side (coercivity of app. 125 Oe, remanence magnetization of app. 80 emu/cm3)
  • effective magnetic moment 0.25x of standard probes
  • metallic electrical conductivity
  • guaranteed tip radius of curvature < 15 nm
  • magnetic resolution better than 25 nm
  • Al coating on detector side of cantilever enhancing the reflectivity of the laser beam by a factor of about 2.5
  • excellent mechanical Q-factor under UHV conditions for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

As both coatings are almost stress-free the bending of the cantilever due to stress is less than 3.5% of the cantilever length. For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended.

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency / kHz 75 45 - 115
Force Constant /(N/m) 2.8 0.5 - 9.5
Length /µm 225 215 - 235
Mean Width /µm 28 20 - 35
Thickness /µm 3 2 - 4
Quality Factor 30000 30000 - 50000
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
SSS-QMFMR-10 10 of all probes

Special handling information for NANOSENSORS™

Due to their unique geometry the tips of the are more susceptible to tip damage by electrostatic discharge (ESD) than other Silicon-SPM-Probes.

Electric fields near the probe chip may lead to field evaporation which can blunt the tip apex of the probe tip. Therefore the NANOSENSORS™ are shipped in specially designed ESD-safe chip carriers.

NANOSENSORS™ recommends to their customers to take appropriate precautions to avoid tip damage due to electrostatic discharge when handling the probes. This can for example be done by using anti-electrostatic mats, wrist bands and tweezers.

NANOSENSORS™ Magnetic Force Microscopy MFM Silicon Probes