PPP-ZEILR

PointProbe® Plus ZEISS Veritekt Microscopes - Contact Mode Low Force Constant - Reflex Coating

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

For owners of a Zeiss Veritekt or Seiko Instruments microscope using contact mode we recommend NANOSENSORS™ PPP-ZEILR (Zeiss Veritekt / low force constant). Compared to the contact mode AFM probe (CONT) the force constant is slightly increased.

The probe offers unique features:

  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of cantilever
  • high mechanical Q-factor for high sensitivity

The reflex coating is an approximately 30 nm thick aluminium coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stres-free coating is bending the cantilever less than 2% of the cantilever length.

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency / kHz 27 19 - 35
Force Constant /(N/m) 1.6 0.6 - 3.9
Length /µm 450 440 - 460
Mean Width /µm 55 47.5 - 62.5
Thickness /µm 4 3 - 5
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-ZEILR-10 10 of all probes
PPP-ZEILR-20 20 of all probes
PPP-ZEILR-50 50
PPP-ZEILR-W 380 of up to 32 probes
NANOSENSORS™ PointProbe® Plus AFM Probes