PointProbe® Plus ZEISS Veritekt Microscopes - Contact Mode Low Force Constant - Reflex Coating
The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
For owners of a Zeiss Veritekt or Seiko Instruments microscope using contact mode we recommend NANOSENSORS™ PPP-ZEILR (Zeiss Veritekt / low force constant). Compared to the contact mode AFM probe (CONT) the force constant is slightly increased.
The probe offers unique features:
- guaranteed tip radius of curvature < 10 nm
- tip height 10 - 15 µm
- highly doped silicon to dissipate static charge
- Al coating on detector side of cantilever
- high mechanical Q-factor for high sensitivity
The reflex coating is an approximately 30 nm thick aluminium coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stres-free coating is bending the cantilever less than 2% of the cantilever length.This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.