SSS-NCH

SuperSharpSilicon™ - Non-Contact / Tapping Mode - High Resonance Frequency

NANOSENSORS™ SSS-NCH AFM probes are designed for non-contact mode or tapping mode AFM.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The probe offers unique features:

guaranteed tip radius of curvature < 5 nm
typical tip radius of curvature of 2 nm
typical aspect ratio at 200 nm from tip apex in the order of 4:1
half cone angle at 200 nm from apex < 10°
monolithic material
highly doped silicon to dissipate static charge
chemically inert
high mechanical Q-factor for high sensitivity

How to optimize AFM scanning parameters:

SuperSharpSilicon AFM tip closeup

Cantilever data:

Property	Nominal Value	Specified Range
Resonance Frequency [kHz]	330	204 - 497
Force Constant [N/m]	42	10 - 130
Length [µm]	125	115 - 135
Mean Width [µm]	30	30 - 45
Thickness [µm]	4	3 - 5

Order codes and shipping units:

Order Code	AFM probes per pack	Data sheet
SSS-NCH-10	10	of all probes
SSS-NCH-20	20	of all probes
SSS-NCH-50	50

Special handling information for NANOSENSORS™

Due to their unique geometry the tips of the are more susceptible to tip damage by electrostatic discharge (ESD) than other Silicon-SPM-Probes.

Electric fields near the probe chip may lead to field evaporation which can blunt the tip apex of the probe tip. Therefore the NANOSENSORS™ are shipped in specially designed ESD-safe chip carriers.

NANOSENSORS™ recommends to their customers to take appropriate precautions to avoid tip damage due to electrostatic discharge when handling the probes. This can for example be done by using anti-electrostatic mats, wrist bands and tweezers.

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