SSS-NCH

SuperSharpSilicon™ - Non-Contact / Tapping Mode - High Resonance Frequency

NANOSENSORS™ SSS-NCH AFM probes are designed for non-contact mode or tapping mode AFM.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The probe offers unique features:

guaranteed tip radius of curvature < 5 nm
typical tip radius of curvature of 2 nm
typical aspect ratio at 200 nm from tip apex in the order of 4:1
half cone angle at 200 nm from apex < 10°
monolithic material
highly doped silicon to dissipate static charge
chemically inert
high mechanical Q-factor for high sensitivity

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

How to optimize AFM scanning parameters:

SuperSharpSilicon AFM tip closeup

Cantilever data:

Property	Nominal Value	Specified Range
Resonance Frequency [kHz]	330	204 - 497
Force Constant [N/m]	42	10 - 130
Length [µm]	125	115 - 135
Mean Width [µm]	30	30 - 45
Thickness [µm]	4	3 - 5

Order codes and shipping units:

Order Code	AFM probes per pack	Data sheet
SSS-NCH-10	10	of all probes
SSS-NCH-20	20	of all probes
SSS-NCH-50	50

Special handling information for NANOSENSORS™

Due to their unique geometry the tips of the are more susceptible to tip damage by electrostatic discharge (ESD) than other Silicon-SPM-Probes.

Electric fields near the probe chip may lead to field evaporation which can blunt the tip apex of the probe tip. Therefore the NANOSENSORS™ are shipped in specially designed ESD-safe chip carriers.

NANOSENSORS™ recommends to their customers to take appropriate precautions to avoid tip damage due to electrostatic discharge when handling the probes. This can for example be done by using anti-electrostatic mats, wrist bands and tweezers.

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