Platinum Silicide Probes Non-Contact / Tapping Mode - High Resonance Frequency

NANOSENSORS™ PtSi-NCH probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For applications that require a wear resistant and an electrically conductive tip we recommend this type. NANOSENSORS™ PtSi-FM probes are suitable for C-AFM, Tunneling AFM and Scanning Capacitance Microscopy (SCM).

The Platinum Silicide coating shows an excellent conductivity (almost approaching metal conductivity). The typical tip radius of curvature is around 25 nm.

The probe offers unique features:
  • platinum silicide coating with excellent conductivity and good wear-out behavior
  • high mechanical Q-factor for high sensitivity
  • alignment grooves on backside of silicon holder chip
This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

How to optimize AFM scanning parameters: list-img
Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 330 204 - 497
Force Constant [N/m] 42 10 - 130
Length [µm] 125 115 - 135
Mean Width [µm] 30 22.5 - 37.5
Thickness [µm] 4 3 - 5
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PtSi-NCH-10 10 of all probes
PtSi-NCH-20 20 of all probes
PtSi-NCH-50 50
NANOSENSORS™ Platinum Silicide AFM Probes