Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 13 6 - 21
Force Constant [N/m] 0.2 0.02 - 0.77
Length [µm] 450 440 - 460
Mean Width [µm] 50 42.5 - 57.5
Thickness [µm] 2 1 - 3
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-CONT-10 10 of all probes
PPP-CONT-20 20 of all probes
PPP-CONT-50 50
PPP-CONT-W 380 of up to 32 probes
NANOSENSORS™ PointProbe® Plus AFM Probes

PointProbe® Plus Contact Mode

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible AFM tip radius as well as a more defined AFM tip shape. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

The AFM probe offers unique features:

  • guaranteed AFM tip radius of curvature < 10 nm
  • AFM tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity
This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.