PointProbe® Plus Contact Mode
The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
The probe offers unique features:
- guaranteed tip radius of curvature < 10 nm
- tip height 10 - 15 µm
- highly doped silicon to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
