PPP-RT-NCHR

PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-RT-NCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

For certain applications the rotated PointProbe® Plus Tip offers more symmetric imaging. The rotated tip shape is identical to the classic tip shape but it is rotated by 180° degrees with respect to the cantilever beam direction.

The probe offers unique features:

  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency / kHz 330 204 - 497
Force Constant /(N/m) 42 10 - 130
Length /µm 125 115 - 135
Mean Width /µm 30 22.5 - 37.5
Thickness /µm 4 3 - 5
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-RT-NCHR-10 10 of all probes
PPP-RT-NCHR-20 20 of all probes
PPP-RT-NCHR-50 50
NANOSENSORS™ PointProbe® Plus AFM Probes