探針がカンチレバー先端より突出し、直上から探針先端を観察可能。NANOSENSORS アドバンスドテック AdvancedTEC™ (ATEC) プローブ

アドバンスドテックシリーズはシャープな三角錐の探針がカンチレバー先端より更に前方へと突き出ているのが特長。

探針を確実に測定領域にポジショニングしたい場合や、探針先端を直接見ながら作業するナノマニピュレーションなどのアプリケーションに最適です。

Screencasts on the NANOSENSORS AdvancedTEC  tip view AFM probes are also available in English:

 

 

Calibration Service for AFM Cantilevers

The NANOSENSORS screencast on the calibration service for AFM cantilevers has just reached the 500 views mark

Accurately determined cantilever properties are very important for quantitative force measurements. Force constant and resonance frequency are determined either by thermal tune, the Sader- or the dimensional method, respectively. Usually, the thermal tune method delivers the most precise values, but suffers from the fact that the AFM tip has to get in contact with the surface to calibrate the photo-detector sensitivity. This procedure may damage or break the tip!

NANOSENSORS™ offers a thermal tune calibration procedure performed by Laser vibrometry. This method is contact free and therefore does no damage the tip, but preserves the original AFM tip quality. To ensure the highest level of accuracy NANOSENSORS™ cantilever calibration method is calibrated with a standard, certified by the national German metrology institute.

This service is part of our Special Development List.
Please have a look at http://www.nanosensors.com/pdf/SpecialDevelopmentsList.pdf or contact us at info@nanosensors.com for further information.

Consistent AFM tip shape leading to reproducible results – NANOSENSORS PointProbe Plus Screencast passes 500 views mark

The screencast held by Head of R&D Thomas Sulzbach  on the  NANOSENSORS PointProbe® Plus Silicon AFM probe series  with a consistent tip shape leading to more reproducible results has just passed the 500 views mark.
Congratulations Thomas!

Screencasts on the PointProbe® Plus are also available in Japanese

and in Chinese:

also on youku http://v.youku.com/v_show/id_XNzMyMDg2MjQ4.html