Conductive Polymer-Ag Honeycomb Thin Film: The Factors Affecting the Complexity of the Microstructure

“Fast growth in Internet of Things (IoT) has attracted a lot of attention of flexible and easily processable hybrid organic-inorganic nanomaterials, integrated into modern electronics and applied in multidisciplinary fields. Nanoporous and microporous thin films with regularly ordered pores exemplified by honeycomb films have received considerable interest due to its diverse potential applications, such as optoelectronics, microstructured electrodes, sensors, and charge storage devices, synthetic templates for nanoparticles, catalytic supports with large surface areas, scaffold materials in biotechnology and separation. Various materials have been applied for the synthesis of the honeycomb structures, such as star polymers, hyperbranched polymers, surfactant-encapsulated polyoxometalate for polystyrene, cross-linkable monomers,and biological molecules.”*

In the article cited here Sajjad Husain Mir and Bungo Ochiai have investigated the factors affecting the micro-structuration of the polymer-Ag honeycomb films and investigated the I-V characteristics. The pore sizes of the polymer-Ag honeycomb films were feasibly tuned by altering various parameters, namely, casting volume, polymer concentration, and molecular weight of the grafted poly(methyl methacrylate) (PMMA) chain.*

The current-sensing scanning probe microscopy (CSSPM) images for this article were taken using a NANOSENSORS™ Platinum-Silicide AFM probe. ( PtSi-CONT ).

Figure 6 from Mir & Ochiai "Conductive Polymer-Ag Honeycomb Thin Film: The Factors Affecting the Complexity of the Microstructure* a) Topography SPM image, and b)I-V curves of the polymer-Ag honeycomb film on HOPG (preparation conditions for polymer-Ag honeycomb film: poly(NVK-co-MAH)-g-PMMA from PMMA (Mn=2100), 0.3 mg mL−1 and 50μL; measurement conditions: topography SPM image was taken by contact mode using microfabricated PtSi- coated cantilever (f0: 15 kHz, C: 0.2 N m−1), and the I-V curves were taken at specific points. NANOSENSORS PtSi-CONT AFM probes were used for the Current-sensing scanning probe microscopy (CSSPM) images
Figure 6 from Mir & Ochiai “Conductive Polymer-Ag Honeycomb Thin Film: The Factors
Affecting the Complexity of the Microstructure*
a) Topography SPM image, and b) I-V curves of the polymer-Ag honeycomb film on HOPG (preparation conditions for polymer-Ag honeycomb film: poly(NVK-co-MAH)-g-PMMA from PMMA (Mn=2100), 0.3 mg mL−1 and 50μL; measurement conditions: topography SPM image was taken by contact mode using microfabricated PtSi-coated cantilever (f0: 15 kHz, C: 0.2 N m−1), and the I-V curves were taken at specific points.

*Sajjad Husain Mir,  Bungo Ochiai
Conductive Polymer-Ag Honeycomb Thin Film: The Factors Affecting the Complexity of the Microstructure
Journal of The Electrochemical Society, 165 (8) B3030-B3034 (2018)
JES Focus issue on ubiquitous sensors and systems for IOT
DOI: 10.1149/2.0031808jes

Open Access The article “Conductive Polymer-Ag Honeycomb Thin Film: The Factors Affecting the Complexity of the Microstructure” by Sajjad Husain Mir and Bungo Ochiai is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit https://creativecommons.org/licenses/by/4.0/.

Resonant torsion magnetometry in anisotropic quantum materials

Who said that AFM probes can only be used for Atomic Force Microscopy?

In the article “Resonant torsion magnetometry in anisotropic quantum materials” which just appeared in Nature Communications, K. A. Modic, Maja D. Bachmann, B. J. Ramshaw, F. Arnold, K. R. Shirer, Amelia Estry, J. B. Betts, Nirmal J. Ghimire, E. D. Bauer, Marcus Schmidt, Michael Baenitz, E. Svanidze, Ross D. McDonald, Arkady Shekhter and Philip J. W. Moll use the NANOSENSORS™ Akiyama-probe for resonant torsion magnetometry.

Figure 1 from "Resonant torsion magnetometry in anisotropic quantum materials": Schematic overview of resonant torsion magnetometry. a First and second derivatives of the free energy with respect to the magnetic field B and the field orientation θ. b The quartz tuning fork of the Akiyama A-probe (http://www.akiyamaprobe.com) is electrically excited at the lowest-resonance mode of the silicon cantilever, producing a large out-of-plane motion at the tip of the cantilever. c Schematic representing the principle of measuring the magnetotropic coefficient k. In a magnetic field, the magnetic torque brings the lever to a new equilibrium position. The magnetic energy of the samples changes the effective stiffness of the lever, leading to a shift in the resonant frequency. d The silicon cantilever glued to each leg of the quartz tuning fork with a single crystal of RuCl3 mounted at the tip with Bayer silicone grease
Figure 1 from “Resonant torsion magnetometry in anisotropic quantum materials”: Schematic overview of resonant torsion magnetometry a First and second derivatives of the free energy with respect to the magnetic field B and the field orientation θ. b The quartz tuning fork of the Akiyama A-probe (http://www.akiyamaprobe.com) is electrically excited at the lowest-resonance mode of the silicon cantilever, producing a large out-of-plane motion at the tip of the cantilever. c Schematic representing the principle of measuring the magnetotropic coefficient k. In a magnetic field, the magnetic torque brings the lever to a new equilibrium position. The magnetic energy of the samples changes the effective stiffness of the lever, leading to a shift in the resonant frequency. d The silicon cantilever glued to each leg of the quartz tuning fork with a single crystal of RuCl3 mounted at the tip with Bayer silicone grease

There are three advantages why it makes sense to divert the NANOSENSORS™ Akiyama-probe from it’s orginal intended use and use it for resonant torque magnetometry instead:

1. the relatively large spring constant of the silicon cantilever allows the authors to extend ultrasensitive and dynamic cantilever magnetometry to macroscopic sample sizes

  1. “the placement of the sample on the silicon cantilever (rather than one leg of a quartz tuning fork) eliminates complications that arise from the center of mass motion of the tuning fork coupling to the resonance mode

3. the electrical read-out of the A-probe eliminates the need for optical detection of the resonant frequency, thus making setup relatively straightforward and more robust compared to previous approaches.”*

*K. A. Modic, Maja D. Bachmann, B. J. Ramshaw, F. Arnold, K. R. Shirer, Amelia Estry, J. B. Betts, Nirmal J. Ghimire, E. D. Bauer, Marcus Schmidt, Michael Baenitz, E. Svanidze, Ross D. McDonald, Arkady Shekhter; Philip J. W. Moll
Resonant torsion magnetometry in anisotropic quantum materials
Nature Communications, volume 9, Article number: 3975 (2018)
DOI: https://doi.org/10.1038/s41467-018-06412-w

For the full article please follow this external link: https://rdcu.be/7Z0A

Open Access The article “Resonant torsion magnetometry in anisotropic quantum materials” by K.A. Modic et. al is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

 

 

Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films

A NANOSENSORS AdvancedTEC ATEC-EFM PtIr coated AFM probe was used for the piezo force microscopy (PFM) characterization in this interesting paper by Borderon et.al Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films published in Nature Communications.

Figure 1 from Borderon et al. Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films: Piezoelectric Force Microscopy (PFM) characterization of the epitaxial PZT thin films. The scan size is 2 μm×1 μm for the c-domain ample and 1 μm × 0.5 μm for the a/c-domain sample. PFM characterization done with ATEC-EFM AFM probe
Figure 1 from Borderon et.al Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films: Piezoelectric Force Microscopy (PFM) characterization of the epitaxial PZT thin films. The scan size is 2 μm×1
μm for the c-domain ample and 1 μm × 0.5 μm for the a/c-domain sample.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

C. Borderon, A. E. Brunier, K. Nadaud, R. Renoud, M. Alexe, H. W. Gundel
Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films
Nature Scientific Reports, volume 7, Article number: 3444 (2017)
doi: https://doi.org/10.1038/s41598-017-03757-y

To read the full article please follow this external link: https://rdcu.be/5qTo

Open Access:  The article  Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films  by Borderon et.al is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing,  adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/