The article “Direct imaging of Defect Formation in Strained Organic Flexible Electronics by Scanning Kelvin Probe Microscopy” by Tobias Cramer et. al. is licensed under a Creative Commons Attribution 4.0 International License. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
Prof. Ohmichi from Kobe University presented his first results on magnetometry using the NANOSENSORS Membrane-type Surface-stress Sensor (MSS) (NANOSENSORS special development code: SD-MSS-1K) at the 72nd Annual Meeting, the Physical Society of Japan (JPS) (Osaka University, Toyonaka Campus, March 17 – 20, 2017).
Congratulations to Professor Ohmichi for the excellent results!
Kobe Univ., Graduate School of Science, Kobe Univ., Faculty of ScienceA, Kobe Univ., Org. Adv. Integ. Res.B, Kobe Univ., Mol. Photosci. Res. CenterC Ohmichi, K. IshimuraA, T. Okamoto, H. TakahashiB, and H. OhtaC