New MSS Sensor for Torque Magnetometry added to the Special Development List

NANOSENSORSTM has completed the development of a new Membrane-type Surface-stress Sensor (MSS) dedicated for torque magnetometry.

Torque magnetometry is a useful technique often employed for assessment of various materials like organic conductors, magnetic and superconductor materials.

Now NANOSENSORSTM has added this new type “SD-MSS-1KTM” to the Special Development list .

The new sensor chip shares the common MSS features, i.e., a membrane (or platform) supported with four beams on which piezoresistors are embedded at the fixed ends. In the newly developed sensor chip, however, those sensing beams are much longer than in the other two MSS chips (SD-MSS-1K and SD-MSS-1K2G) and form “bending” and “torsional” axes.

For two different functional axes, differently designed piezoresistors are embedded to effectively sense the torque generated by the sample. Considering a use at cryogenic temperatures, the resistance of the piezoresistor is designed relatively low and in the range of 0.3 – 1.2 kΩ. Each piezoresistor can be individually connected so that various measurement configurations can be arranged by the user.

Compared to the conventionally used piezoresistive cantilevers, the new type of Membrane-type Surface-stress Sensor “SD-MSS-1KTM” has many advantages:

  • easier to handle the chip
  • relatively robust structure
  • larger sample capability, etc.,

all of which facilitate preparations of measurement setup and increase turnaround of material assessment.

For further technical information, price or delivery times please contact us at info@nanosensors.com

NANOSENSORS™ MSS dedicated for torque magnetometry “SD-MSS-1KTM”
NANOSENSORS™ Membrane-type Surface-stress Sensor (MSS) dedicated for torque magnetometry “SD-MSS-1KTM”

 

drawing illustrating the principle of operation of the NANOSENSORS SD-MSS-1KTM membrane-type surface stress sensor dedicated for torque magnetometry
drawing illustrating the principle of operation of the NANOSENSORS SD-MSS-1KTM membrane-type surface stress sensor dedicated for torque magnetometry

R&D News: New MSS Sensor Dedicated for Torque Magnetometry under Development

In a recent blogpost we shared the news that NANOSENSORSTM Membrane-type Surface-stress Sensors (MSS) could successfully be used for torque magnetometry .

We have therefore decided to develop a new MSS series sensor chip that is dedicated to measure force and torque.
The new sensor chip will be called SD-MSS-1KTM and is currently in the beta testing phase.

The new sensor chip shares the common MSS features, i.e., a membrane (or platform) supported with four beams on which piezoresistors are embedded at the fixed ends.

In the newly developed sensor chip dedicated for torque magnetometry however, those sensing beams are much longer than those of the currently available MSS chips and form “bending” and “torsional” axes.

Further technical information will be announced upon an official product release. For any other questions or requests please contact us at info@nanosensors.com

a drawing of the NANOSENSORS SD-MSS-1KTM membrane-type surface stress sensor dedicated for torque magnetometry which is currently under development
a drawing of the NANOSENSORS SD-MSS-1KTM membrane-type surface stress sensor dedicated for torque magnetometry which is currently under development

Near-Field Plasmonic probe with Super Resolution and High Throughput and Signal-to-Noise Ratio

Plasmonic AFM tip using a quartz-like NANOSENSORS qp-CONT as basis, as described in: Ruei-Han Jiang et Al., Near-Field Plasmonic Probe with Super Resolution and High Throughput and Signal-to-Noise Ratio, Nano Letters Article ASAP DOI: 10.1021/acs.nanolett.7b04142, image courtesy of Ruei-Han Jiang, Department of Materials Science and Engineering National Tsing Hua University
Plasmonic AFM tip using a quartz-like NANOSENSORS Uniqprobe qp-CONT as basis, image courtesy of Ruei-Han Jiang, Department of Materials Science and Engineering, National Tsing Hua University

In the recently published article “New-Field Plasmonic probe with Super Resolution and High Throughput and Signal-to-Noise Ratio by Ta-Jen Yen et. Al. a plasmonic tip is described that could be employed in near-field optics, nanolithography, tip-enhanced Raman spectroscopy and other applications.

The authors of the article demonstrate what other papers have already talked about in the past: it is possible to use probes like the NANOSENSORS Uniqprobe qp-CONT as basis to make working probes for NSOM or TERS, by using radially polarized light. They go a step further by FIB tailoring the metal film that fully covers the transparent tip.

Congratulations to the authors!

You can find the full article if you follow this external link:

Ruei-Han Jiang, Chi Chen, Ding-Zheng Lin, He-Chun Chou, Jen-You Chu, and Ta-Jen Yen
Near-Field Plasmonic Probe with Super Resolution and High Throughput and Signal-to-Noise Ratio
Nano Letters Article ASAP
DOI: 10.1021/acs.nanolett.7b04142
http://pubs.acs.org/doi/full/10.1021/acs.nanolett.7b04142

A lot of work was done by research groups at the University of Neuchâtel, more than 10 years back, demonstrating the high resolution properties of microfabricated apertureless (fully metal coated) transparent quartz tips, where a connection between the observed high spatial resolution and longitudinally polarized fields confined at the probe apex was observed. The authors gave direct experimental evidence that, after injection of a radially polarized beam, a confined single spot is produced at the tip apex.

For further relevant papers, also refer to:

Tortora, E. Descrovi, L. Aeschimann, L. Vaccaro, H.-P. Herzig, R. Dändliker,
Selective coupling of HE 11 and TM 01 modes into microfabricated fully metal-coated quartz probes, Ultramicroscopy 107, 158 (2007), https://doi.org/10.1016/j.ultramic.2006.07.004
https://www.sciencedirect.com/science/article/pii/S030439910600146X

Descrovi, L. Vaccaro, L. Aeschimann, W. Nakagawa, U. Staufer, H.-P. Herzig,
Optical properties of microfabricated fully-metal-coated near-field probes in collection mode, J. Opt. Soc. Am. A/Vol. 22, No 7 (2005), https://doi.org/10.1364/JOSAA.22.001432
https://www.osapublishing.org/josaa/abstract.cfm?uri=josaa-22-7-1432

Descrovi, L. Vaccaro, W. Nakagawa, L. Aeschimann, U. Staufer, H.-P. Herzig,
Collection of transverse and longitudinal fields by means of apertureless nanoprobes with different metal coating characteristics, J. Appl. Phys. Lett., vol. 85, 5340 (2004), https://doi.org/10.1063/1.1827925
http://aip.scitation.org/doi/10.1063/1.1827925