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NANOSENSORS™ introduces new Wear Resistant Conductive AFM Probe Series

NANOSENSORS™ announced that the first two types of a new innovative SPM probes series of wear resistant and highly conductive AFM tips will be introduced today.

The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.

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NANOSENSORS™ introduces self-sensing self-actuating Akiyama-Probe

Akiyama-probe

NANOSENSORS™ today announced the introduction of the Akiyama-probe

Akiyama-probeThe Akiyama-probe has been developed in cooperation with the Institute of Microtechnology (IMT) at the University of Neuchâtel for the NANOSENSORS™ brand that is specialized on cutting edge scanning probes for Atomic Force Microscopy (AFM) applications. The product is called the Akiyama-probe or A-probe to honour its inventor Dr. Terunobu Akiyama. It is a novel self-sensing and – actuating probe based on a quartz tuning fork combined with a micromachined cantilever for dynamic mode AFM.

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NANOSENSORS™launches new Silicon Plateau Tip Series

Plateu-tip

NANOSENSORS™ has launched a new series of silicon Plateau Tips today.

Plateu-tipThe Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.

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NANOSENSORS™ introduces next generation XY-Alignment AFM probe – easy tip exchange without laser repositioning

NANOSENSORS™ today introduced its new PointProbe® Plus XY-Alignment series.

The invention of the Alignment Chip by NANOSENSORS™ more than 10 years ago marked a big step in the direction of AFM probe design for easy to use AFM systems. It offered the possibility of a fast and easy tip exchange without the necessity to reposition the laser beam after the exchange of a probe.

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