NanoInk® compatible Silicon Nitride AFM Probe Arrays available from NANOSENSORS Special Developments List
NANOSENSORS™ Nanoink® compatible
Silicon Nitride Arrays
NANOSENSORS™ develops many AFM tip varieties that are not commercialized as standard products but still are available on demand. We call these customized products “Special Developments”.
Among these Special Developments are also some Silicon Nitride AFM Probe Arrays that among other applications can also be used as DPN pens and are therefore compatible with some NanoInk® instruments.
NANOSENSORS™ not only uses its know-how to manufacture its well-known standard products. The experts at NANOSENSORS™ also develop many tip versions and other developments that are not commercialized as standard products but are available on demand. We call these customized products “Special Developments”.
The Akiyama-probe has been developed in cooperation with the Institute of Microtechnology (IMT) at the University of Neuchâtel for the NANOSENSORS™ brand that is specialized on cutting edge scanning probes for Atomic Force Microscopy (AFM) applications. The product is called the Akiyama-probe or A-probe to honour its inventor Dr. Terunobu Akiyama. It is a novel self-sensing and – actuating probe based on a quartz tuning fork combined with a micromachined cantilever for dynamic mode AFM.
The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.