AFM probes for Magnetic Force Microscopy Screencast passed 1000 views mark

NANOSENSORS offers six different types of AFM probes for Magnetic Force Microscopy ( MFM)  for scanning and studying sample surfaces with magnetic features:

PPP-MFMR
PPP-LM-MFMR
PPP-LC-MFMR
PPP-QLC-MFMR
SSS-MFMR
SSS-QMFMR

The screencast introducing the different properties of these AFM probes and their applications held by our Head of R&D Thomas Sulzbach has just passed the 1000 views mark. Congratulations Thomas!