NANOSENSORS Q30K-Plus – Silicon AFM probes for UHV applications

Did you already know that NANOSENSORS offers four different kinds of AFM probes especially designed for use in UHV applications?

For high sensitivity and a good signal to noise ratio these probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800nm).

In addition to the enhanced Q-factor and the optimized signal to noise ratio the Q30K-Plus series offers all features of the PointProbe® plus series like a minimized variation in tip shape and a typical tip radius of less than 7nm for the standard silicon AFM tips.

Q30K-Plus Standard silicon tips:

PPP-QNCHR for Non-Contact Mode/Tapping Mode™
Resonance Frequency = 330 kHz
Force Constant = 42 N/m
Quality Factor = 30000

PPP-QFMR for Force Modulation Mode (hyperlink leading to : )
Resonance frequency = 75 kHz
Force constant = 2.8 N/m
Quality Factor = 30000

Q30K-Plus AFM tips with magnetic coating:

PPP-QLC-MFMR for magnetic force microscopy of soft magnetic samples and high operation stability under UHV conditions
Resonance frequency = 75 kHz
Force constant = 2.8 N/m
Low coercivity
Quality Factor > 30000

SSS-QMFMR small radius of the coated tip, high aspect ratio at the last few hundred nanometers of the tip for outstanding lateral resolution in the magnetic force image and high operation stability under UHV conditions
Resonance frequency = 75 kHz
Force constant = 2.8 N/m
Quality Factor > 30000

For more detailed information please click on the ordercodes to access the respective spec sheets on the NANOSENSORS website or contact info@nanosensors.com.

NANOSENSORS_Q30K_Plus_AFM_tip_for_UHV

NANOSENSORS Q30K-Plus AFM tip for UHV applications