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PPP-QLC-MFMR

Point Probe® Plus - Magnetic Force Microscopy - High Quality-Factor - Low Coercivity - Reflex Coating

The NANOSENSORS™ PPP-QLC-MFMR AFM probe combines the low disturbance of magnetic samples by a soft magnetic coating with the high mechanical quality factor under ultra high vacuum conditions of the Q30K-Plus-Series. Low coercivity and a Q-factor of more than 35,000 enable magnetic force microscopy of soft magnetic samples and high operation stability under UHV conditions. Due to the low coercivity of the tip coating the magnetisation of the tip will easily get reoriented by hard magnetic samples.

The soft magnetic coating on the tip has a coercivity of app. 0.75 Oe and a remanence magnetization of app. 225 emu/cm3 (these values were determined on a flat surface).

The SPM probe offers unique features:

As both coatings are almost stress-free the bending of the cantilever due to stress is less than 3.5% of the cantilever length. For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended.

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
Quality Factor 30000 30000 - 50000

Order codes and shipping units:

Order Code Number of AFM probes per pack Data sheet Coating
PPP-QLC-MFMR-10 10 of all probes hard magnetic and reflex


Product screencast NANOSENSORS™ Magnetic Force Microscopy MFM Silicon Probes

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