Neuchâtel, February 26st, 2016
In this application image we used the small cantilever of the NANOSENSORS™ uniqprobe® BioT to scan in ScanAsyst® mode in air. We imaged crystallites with nanometer-sized edge features with a scan size of 1 µm and a speed of 2 µm/s. Even in a that large, micrometer size image of a surface with ...
Neuchâtel, August 29th, 2014
For applications in biology and life sciences, where soft cantilevers are needed, we developed a dedicated Product Series: the NANOSENSORS uniqprobe...
Neuchâtel, October 5th, 2015
Dr. Oliver Krause, product developer at NANOSENSORS™ is talking in this screencast about AFM probes for dynamic AFM with sub-nanometer ...
Neuchâtel, June 12, 2014
Check out the latest video about the history of NANOSENSORS Probes for Atomic Force Microscopy, presented by Dr. Oliver Krause
Neuchâtel, March 4th, 2016
30 years ago, on March 3rd 1986, Gerd Binnig, Carl Quate and Christoph Gerber published a paper simply titled Atomic Force Microscope. Happy Birthday!
Neuchâtel, May 26th, 2015
NANOSENSORS has added a new type of rounded AFM tips to the Special Development List. The new rounded AFM tips SD-R30 have a typical tip radius of 30 nm and are available in combination with three different cantilever types. (NCH – standard tapping mode cantilever, FM – force modulation mode cantilever and CONT – contact mode cantilever).