Neuchâtel, June 22nd, 2014
NANOSENSORS™ announced that a screencast explaining the advantages of a completely new SPM (Scanning Probe Microscopy) probe series called uniqprobe dedicated for use in biological and life science applications has been uploaded on its website and YouTube channel.
Neuchâtel, June 12, 2014
Check out the latest video about the history of NANOSENSORS Probes for Atomic Force Microscopy, presented by Dr. Oliver Krause
Neuchâtel, March 24, 2014
New Product Screencast on the NANOSENSORS™ Diamond Coated PointProbe® Plus silicon AFM Probes by Jörg Diebel
Neuchâtel, January 15th, 2014
NANOSENSORS™ announced that now all three basic types of the new innovative SPM probes series of wear resistant and highly conductive AFM tips are available.
The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.
Neuchâtel, December 3rd 2013
NANOSENSORS™ announced that four types of a completely new SPM (Scanning Probe Microscopy) probe series with unsurpassed uniformity of cantilever force constant and resonance frequency range will be introduced today.
The NANOSENSORS uniqprobe combines the well-known features of the other NANOSENSORS AFM probe series such as high application versatility and compatibility with most commercial SPMs with the additional advantage of a strongly reduced dispersion of force constant and resonance frequency.
Founded in 1989 NANOSENSORS™ was the first company to commercially manufacture batch fabricated silicon AFM probes. Since then NANOSENSORS is the worldwide technology leader in scanning probes using its long experience to provide the most consistent AFM probes quality, year by year, batch by batch, wafer by wafer, probe by probe. Everywhere where consistent quality and reproducible results are necessary NANOSENSORS™ AFM probes are the probes of choice.