Non-Contact / Tapping Mode (NC)

uniqprobe™

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qp-BioT
  • uniform quality SPM probe
  • XY-auto alignment with Alignment Chip
  • 2 cantilevers
  • C1 = 0.3 N/m; fo1 = 50 kHz
  • C2 = 0.08 N/m; fo2 = 20 kHz
  • Backside partial Au coating
qp-BioAC
  • uniform quality SPM probe
  • XY-auto alignment with Alignment Chip
  • 3 cantilevers
  • C1 = 0.3 N/m; fo1 = 90 kHz
  • C2 = 0.1 N/m; fo2 = 50 kHz
  • C3 = 0.06 N/m; fo3 = 30 kHz
  • Backside partial Au coating

Platinum Silicide AFM Probes

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PtSi-NCH
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
  • PtSi coated probe

AdvancedTEC™

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ATEC-NC
  • Advanced Tip at the End of the
    Cantilever™
  • real tip visibility from top
  • Non-Contact
  • C = 45 N/m; fo = 335 kHz
ATEC-NCPt
  • Advanced Tip at the End of the
    Cantilever™
  • real tip visibility from top
  • Non-Contact
  • C = 45 N/m; fo = 335 kHz
  • PtIr5 coated probe
ATEC-NCAu
  • Advanced Tip at the End of the
    Cantilever™
  • real tip visibility from top
  • Non-Contact
  • C = 45 N/m; fo = 335 kHz
  • Au coating (both sides)

PointProbe® Plus

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PPP-NCH
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
PPP-NCL
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
PPP-NCST
  • Non-Contact Soft Tapping
  • C = 7.4 N/m; fo = 160 kHz
PPP-NCHR
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
  • Backside Reflex coating
PPP-XYNCHR
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
  • Backside Reflex coating
PPP-QNCHR
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
  • Backside Reflex coating
PPP-NCLR
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
  • Backside Reflex coating
PPP-NCSTR
  • Non-Contact Soft Tapping
  • C = 7.4 N/m; fo = 160 kHz
  • Backside Reflex coating
PPP-SEIHR
  • for Seiko Instruments microscope
  • C = 15 N/m; fo = 130 kHz
  • Backside Reflex coating

PointProbe® Plus XY-Alignment AFM-Probe

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PPP-XYNCHR
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
  • Backside Reflex coating
PPP-XYNCSTR
  • C = 7.4 N/m; fo = 160 kHz
  • Backside Reflex coating
PPP-NCLR
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
  • Backside Reflex coating
PPP-NCL
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
PPP-NCLAuD
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
  • Au coating on detector side
PPP-SEIHR
  • for Seiko Instruments microscope
  • C = 15 N/m; fo = 130 kHz
  • Backside Reflex coating

XY-Alignment Compatible SuperSharpSilicon™ Types

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SSS-NCL
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
SSS-SEIH
  • for Seiko Instruments microscope
  • C = 15 N/m; fo = 130 kHz
SSS-NCLR
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
  • Backside Reflex coating
SSS-SEIHR
  • for Seiko Instruments microscope
  • C = 15 N/m; fo = 130 kHz
  • Backside Reflex coating

XY-Alignment Compatible High Aspect Ratio Probe Types

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AR5-NCL
  • High Aspect Ratio Tip
  • Aspect Ratio ≥ 5:1
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
AR5-NCLR
  • High Aspect Ratio Tip
  • Aspect Ratio ≥ 5:1
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
  • Backside Reflex coating

XY-Alignment Compatible Coated Probe Types

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DT-NCLR
  • Non-Contact Long cantilever
  • C = 72 N/m; fo = 210 kHz
  • Backside Reflex coating
PPP-NCLAu
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
  • Au coating (both sides)

XY-Alignment Compatible Tipless Cantilever Probe Types

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TL-NCL
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
PL2-NCL
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
PL2-NCLR
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
  • Backside Reflex coating

SuperSharpSilicon™

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SSS-NCH
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
SSS-NCL
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
SSS-SEIH
  • for Seiko Instruments microscope
  • C = 15 N/m; fo = 130 kHz
SSS-NCHR
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
  • Backside Reflex coating
SSS-NCLR
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
  • Backside Reflex coating
SSS-SEIHR
  • for Seiko Instruments microscope
  • C = 15 N/m; fo = 130 kHz
  • Backside Reflex coating

High Aspect Ratio

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AR5-NCH
  • High Aspect Ratio Tip
  • Aspect Ratio ≥ 5:1
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
AR5T-NCH
  • High Aspect Ratio Tip
  • Aspect Ratio ≥ 5:1
  • Tilt compensation: 13°
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
AR5-NCL
  • High Aspect Ratio Tip
  • Aspect Ratio ≥ 5:1
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
AR10-NCH
  • High Aspect Ratio Tip
  • Aspect Ratio ≥ 10:1
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
AR10T-NCH
  • High Aspect Ratio Tip
  • Aspect Ratio ≥ 10:1
  • Tilt compensation: 13°
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
AR5-NCHR
  • High Aspect Ratio Tip
  • Aspect Ratio ≥ 5:1
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
  • Backside Reflex coating
AR5-NCLR
  • High Aspect Ratio Tip
  • Aspect Ratio ≥ 5:1
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
  • Backside Reflex coating
AR10-NCHR
  • High Aspect Ratio Tip
  • Aspect Ratio ≥ 10:1
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
  • Backside Reflex coating
AR10T-NCHR
  • High Aspect Ratio Tip
  • Aspect Ratio ≥ 10:1
  • Tilt compensation: 13°
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
  • Backside Reflex coating
AR5T-NCHR
  • High Aspect Ratio Tip
  • Aspect Ratio ≥ 5:1
  • Tilt compensation: 13°
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
  • Backside Reflex coating

Rotated Tip

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PPP-RT-NCHR
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
  • Backside Reflex coating

Tipless Cantilever

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TL-NCH
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
TL-NCL
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz

Plateau Tip

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PL2-NCH
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
PL2-NCL
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
PL2-NCHR
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
  • Backside Reflex coating
PL2-NCLR
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
  • Backside Reflex coating

PointProbe® Plus Gold coated

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PPP-NCHAuD
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
  • Au coating on detector side
PPP-NCHAu
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
  • Au coating (both sides)
PPP-NCLAuD
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
  • Au coating on detector side
PPP-NCLAu
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
  • Au coating (both sides)
PPP-NCSTAu
  • Non-Contact Soft Tapping
  • C = 7.4 N/m; fo = 160 kHz
  • Au coating (both sides)
PPP-NCSTAuD
  • Non-Contact Soft Tapping
  • C = 7.4 N/m; fo = 160 kHz
  • Au coating on detector side

Diamond coated

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DT-NCHR
  • Non-Contact High frequency
  • C = 80 N/m; fo = 400 kHz
  • Backside Reflex coating
DT-NCLR
  • Non-Contact Long cantilever
  • C = 72 N/m; fo = 210 kHz
  • Backside Reflex coating
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